Inventor
TAMANO TAKUYA
US4 patents
Patents
4 patentsUS12100467B2Sep 24, 2024
Systems and methods for testing redundant fuse latches in a memory device
MICRON TECHNOLOGY INC0 citations60
US12394501B2Aug 19, 2025
Apparatus with adjustable diagnostic mechanism and methods for operating the same
MICRON TECHNOLOGY INC0 citations59
US12100476B2Sep 24, 2024
Test mode security circuit
MICRON TECHNOLOGY INC0 citations59
US11791011B1Oct 17, 2023
Self-repair verification
MICRON TECHNOLOGY INC0 citations47