Inventor
KURZ STEFAN
DE9 patents
⚠️ This page may combine multiple inventors who share the name “KURZ STEFAN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
MULTITEST ELEKTRONISCHE SYST
4 patentsUS7633304B2Dec 15, 2009
Device for testing electronic components, in particular ICs, having a sealing board arranged inside a pressure test chamber
MULTITEST ELEKTRONISCHE SYST5 citations59
US7741861B2Jun 22, 2010
Test apparatus for the testing of electronic components
MULTITEST ELEKTRONISCHE SYST2 citations51
US9255965B2Feb 9, 2016
System for post-processsing of electronic components
MULTITEST ELEKTRONISCHE SYST0 citations47
US9014841B2Apr 21, 2015
Device and method for removing tested semiconductor components
MULTITEST ELEKTRONISCHE SYST1 citations45