P

Inventor

SU PO-WEN

TW30 patents
⚠️ This page may combine multiple inventors who share the name “SU PO-WEN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

UNITED MICROELECTRONICS CORP

29 patents
US8853015B1Oct 7, 2014

Method of forming a FinFET structure

UNITED MICROELECTRONICS CORP18 citations92
US9117909B2Aug 25, 2015

Non-planar transistor

UNITED MICROELECTRONICS CORP13 citations84
US10199260B1Feb 5, 2019

Contact hole structure and method of fabricating the same

UNITED MICROELECTRONICS CORP13 citations80
US12245424B2Mar 4, 2025

One-time programmable memory capacitor structure and manufacturing method thereof

UNITED MICROELECTRONICS CORP2 citations74
US9755057B1Sep 5, 2017

Method of fabricating a semiconductor device

UNITED MICROELECTRONICS CORP4 citations73
US12040393B2Jul 16, 2024

High electron mobility transistor and method for fabricating the same

UNITED MICROELECTRONICS CORP1 citations72
US10505007B1Dec 10, 2019

Semiconductor device having asymmetric work function metal layer

UNITED MICROELECTRONICS CORP4 citations72
US10026827B2Jul 17, 2018

Method for fabricating semiconductor device

UNITED MICROELECTRONICS CORP2 citations72
US9899491B2Feb 20, 2018

Semiconductor device and method of forming the same

UNITED MICROELECTRONICS CORP3 citations72
US9443741B1Sep 13, 2016

Etching method for reducing microloading effect

UNITED MICROELECTRONICS CORP5 citations71
US11810786B2Nov 7, 2023

Method for fabricating semiconductor device

UNITED MICROELECTRONICS CORP6 citations70
US10483158B2Nov 19, 2019

Contact hole structure and method of fabricating the same

UNITED MICROELECTRONICS CORP2 citations69
US12356654B2Jul 8, 2025

High electron mobility transistor and method for fabricating the same

UNITED MICROELECTRONICS CORP0 citations62
US12324181B2Jun 3, 2025

High electron mobility transistor and method for fabricating the same

UNITED MICROELECTRONICS CORP0 citations62
US12274081B2Apr 8, 2025

Semiconductor structure and method for forming the same

UNITED MICROELECTRONICS CORP0 citations62
US12218229B2Feb 4, 2025

Semiconductor structure and method for forming the same

UNITED MICROELECTRONICS CORP0 citations62
US12040392B2Jul 16, 2024

High electron mobility transistor and method for fabricating the same

UNITED MICROELECTRONICS CORP0 citations62
US11552187B2Jan 10, 2023

High electron mobility transistor and method for fabricating the same

UNITED MICROELECTRONICS CORP0 citations62
US11929418B2Mar 12, 2024

Metal gate structure and method of fabricating the same

UNITED MICROELECTRONICS CORP0 citations61
US11881518B2Jan 23, 2024

Metal gate structure and method of fabricating the same

UNITED MICROELECTRONICS CORP0 citations61
US11205705B2Dec 21, 2021

Metal gate structure and method of fabricating the same

UNITED MICROELECTRONICS CORP0 citations61
US10522652B1Dec 31, 2019

Method for fabricating semiconductor device with reduced wafer edge defects

UNITED MICROELECTRONICS CORP1 citations60
US11205710B2Dec 21, 2021

Fabricating method of semiconductor structure

UNITED MICROELECTRONICS CORP0 citations59
US9117904B2Aug 25, 2015

Semiconductor structure having trimming spacers

UNITED MICROELECTRONICS CORP2 citations59
US10177245B2Jan 8, 2019

Method of fabricating a semiconductor device

UNITED MICROELECTRONICS CORP0 citations52
US11145733B1Oct 12, 2021

Method of manufacturing a semiconductor device

UNITED MICROELECTRONICS CORP0 citations51
US10043882B2Aug 7, 2018

Method of forming semiconductor device

UNITED MICROELECTRONICS CORP0 citations51
US10283616B2May 7, 2019

Fabricating method of semiconductor structure

UNITED MICROELECTRONICS CORP0 citations49
US9711368B2Jul 18, 2017

Sidewall image transfer process

UNITED MICROELECTRONICS CORP0 citations41

CHOU SHYAN-LIANG

1 patent