P

Inventor

HUBER WALTER

DE55 patents
⚠️ This page may combine multiple inventors who share the name “HUBER WALTER”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

HEIDENHAIN GMBH DR JOHANNES

23 patents
US6198534B1Mar 6, 2001

Scanning unit for an optical position measuring system

HEIDENHAIN GMBH DR JOHANNES55 citations96
US5739911AApr 14, 1998

Position measuring system

HEIDENHAIN GMBH DR JOHANNES21 citations93
US5678319AOct 21, 1997

Index grating having partial fields that are geometrically offset in the measuring direction

HEIDENHAIN GMBH DR JOHANNES28 citations93
US5648658AJul 15, 1997

Apparatus and method for generating position-dependent signals using a scanning plate having a plurality of differently configured scanning regions

HEIDENHAIN GMBH DR JOHANNES32 citations93
US5430546AJul 4, 1995

Optical device for measuring relative position of or angle between two objects

HEIDENHAIN GMBH DR JOHANNES32 citations93
US6175414B1Jan 16, 2001

Optical position measuring device

HEIDENHAIN GMBH DR JOHANNES30 citations92
US5424833AJun 13, 1995

Interferential linear and angular displacement apparatus having scanning and scale grating respectively greater than and less than the source wavelength

HEIDENHAIN GMBH DR JOHANNES36 citations89
US5760959AJun 2, 1998

Interferential position measuring device with three detectors

HEIDENHAIN GMBH DR JOHANNES17 citations84
US7154609B2Dec 26, 2006

Interferential position measuring arrangement

HEIDENHAIN GMBH DR JOHANNES12 citations83
US5696584ADec 9, 1997

Phase grating having an unprotected relief structure with a grating structure that causes destructive interference of reflections

HEIDENHAIN GMBH DR JOHANNES17 citations74
US5689336ANov 18, 1997

Photoelectric position measuring system

HEIDENHAIN GMBH DR JOHANNES15 citations74
US5206704AApr 27, 1993

Position measuring apparatus and method of use thereof

HEIDENHAIN GMBH DR JOHANNES16 citations74
US4988864AJan 29, 1991

Photoelectric angle measuring device with adjacent order interference

HEIDENHAIN GMBH DR JOHANNES8 citations74
US5493397AFeb 20, 1996

Multi-coordinate measuring system using a cross grating to create a plurality of diffraction beams emanating from two or more coordinate directions

HEIDENHAIN GMBH DR JOHANNES16 citations73
US5264915ANov 23, 1993

Interferential measurement device for at least one direction of measurement

HEIDENHAIN GMBH DR JOHANNES15 citations69
US6621069B2Sep 16, 2003

Optical encoder with an electric field—screening grit

HEIDENHAIN GMBH DR JOHANNES6 citations68
US7701593B2Apr 20, 2010

Optical position measuring arrangement

HEIDENHAIN GMBH DR JOHANNES4 citations63
US5519492AMay 21, 1996

Optical arrangement for detecting the intensity modulation of partial ray beams

HEIDENHAIN GMBH DR JOHANNES3 citations63
US9739598B2Aug 22, 2017

Device for interferential distance measurement

HEIDENHAIN GMBH DR JOHANNES1 citations51
US10823550B2Nov 3, 2020

Optical position measuring device

HEIDENHAIN GMBH DR JOHANNES0 citations48
US10048114B2Aug 14, 2018

Device for measuring the vibrational amplitude of a capillary tube of a wire bonder

HEIDENHAIN GMBH DR JOHANNES0 citations42
US9638514B2May 2, 2017

Optical position-measuring device

HEIDENHAIN GMBH DR JOHANNES0 citations42
US7271920B2Sep 18, 2007

Position-measuring device

HEIDENHAIN GMBH DR JOHANNES0 citations42

HOFFMANN LA ROCHE

3 patents

DNS ELECTRONIC MATERIALS INC

2 patents

BARDROFF MICHAEL

2 patents

BASF AG

2 patents

HUBER WALTER

2 patents

HASSLER ANDREAS

1 patent

JOHANNAS HEIDENHAIN GMBH DR

1 patent

ROCHE DIAGNOSTICS CORP

1 patent

JOHANNES HIEDENHEIN GMBH DR

1 patent

BOHRMANN BERND

1 patent

CIBA GEIGY CORP

1 patent

DAIMLER CHRYSLER AG

1 patent

SUMCO PHOENIX CORP

1 patent

SIEMENS AG

1 patent

ITT MFG ENTERPRISES INC

1 patent

GMBH JOHANNES HEIDENHAIN

1 patent

JOERGER RALPH

1 patent

ITT

1 patent

ROCHE DIAGNOSTIC SYSTEMS INC

1 patent

LOETSCHER HANSRUEDI

1 patent

MANNESMANN AG

1 patent

Showing the top 50 of 55 patents by PatentIndex Score.