Inventor
HUBER WALTER
DE55 patents
⚠️ This page may combine multiple inventors who share the name “HUBER WALTER”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
HEIDENHAIN GMBH DR JOHANNES
23 patentsUS6198534B1Mar 6, 2001
Scanning unit for an optical position measuring system
HEIDENHAIN GMBH DR JOHANNES55 citations96
US5739911AApr 14, 1998
Position measuring system
HEIDENHAIN GMBH DR JOHANNES21 citations93
US5678319AOct 21, 1997
Index grating having partial fields that are geometrically offset in the measuring direction
HEIDENHAIN GMBH DR JOHANNES28 citations93
US5648658AJul 15, 1997
Apparatus and method for generating position-dependent signals using a scanning plate having a plurality of differently configured scanning regions
HEIDENHAIN GMBH DR JOHANNES32 citations93
US5430546AJul 4, 1995
Optical device for measuring relative position of or angle between two objects
HEIDENHAIN GMBH DR JOHANNES32 citations93
US6175414B1Jan 16, 2001
Optical position measuring device
HEIDENHAIN GMBH DR JOHANNES30 citations92
US5424833AJun 13, 1995
Interferential linear and angular displacement apparatus having scanning and scale grating respectively greater than and less than the source wavelength
HEIDENHAIN GMBH DR JOHANNES36 citations89
US5760959AJun 2, 1998
Interferential position measuring device with three detectors
HEIDENHAIN GMBH DR JOHANNES17 citations84
US7154609B2Dec 26, 2006
Interferential position measuring arrangement
HEIDENHAIN GMBH DR JOHANNES12 citations83
US5696584ADec 9, 1997
Phase grating having an unprotected relief structure with a grating structure that causes destructive interference of reflections
HEIDENHAIN GMBH DR JOHANNES17 citations74
US5689336ANov 18, 1997
Photoelectric position measuring system
HEIDENHAIN GMBH DR JOHANNES15 citations74
US5206704AApr 27, 1993
Position measuring apparatus and method of use thereof
HEIDENHAIN GMBH DR JOHANNES16 citations74
US4988864AJan 29, 1991
Photoelectric angle measuring device with adjacent order interference
HEIDENHAIN GMBH DR JOHANNES8 citations74
US5493397AFeb 20, 1996
Multi-coordinate measuring system using a cross grating to create a plurality of diffraction beams emanating from two or more coordinate directions
HEIDENHAIN GMBH DR JOHANNES16 citations73
US5264915ANov 23, 1993
Interferential measurement device for at least one direction of measurement
HEIDENHAIN GMBH DR JOHANNES15 citations69
US6621069B2Sep 16, 2003
Optical encoder with an electric field—screening grit
HEIDENHAIN GMBH DR JOHANNES6 citations68
US7701593B2Apr 20, 2010
Optical position measuring arrangement
HEIDENHAIN GMBH DR JOHANNES4 citations63
US5519492AMay 21, 1996
Optical arrangement for detecting the intensity modulation of partial ray beams
HEIDENHAIN GMBH DR JOHANNES3 citations63
US9739598B2Aug 22, 2017
Device for interferential distance measurement
HEIDENHAIN GMBH DR JOHANNES1 citations51
US10823550B2Nov 3, 2020
Optical position measuring device
HEIDENHAIN GMBH DR JOHANNES0 citations48
US10048114B2Aug 14, 2018
Device for measuring the vibrational amplitude of a capillary tube of a wire bonder
HEIDENHAIN GMBH DR JOHANNES0 citations42
US9638514B2May 2, 2017
Optical position-measuring device
HEIDENHAIN GMBH DR JOHANNES0 citations42
US7271920B2Sep 18, 2007
Position-measuring device
HEIDENHAIN GMBH DR JOHANNES0 citations42
HOFFMANN LA ROCHE
3 patentsUS7794719B2Sep 14, 2010
Anti-amyloid β antibodies
HOFFMANN LA ROCHE77 citations96
US9290567B2Mar 22, 2016
Use of an anti-Tau pS422 antibody for the treatment of brain diseases
HOFFMANN LA ROCHE25 citations92
US9272031B2Mar 1, 2016
Antibodies against amyloid beta 4 with glycosylation in the variable region
HOFFMANN LA ROCHE5 citations71
DNS ELECTRONIC MATERIALS INC
2 patentsUS4851358AJul 25, 1989
Semiconductor wafer fabrication with improved control of internal gettering sites using rapid thermal annealing
DNS ELECTRONIC MATERIALS INC149 citations98
US4868133ASep 19, 1989
Semiconductor wafer fabrication with improved control of internal gettering sites using RTA
DNS ELECTRONIC MATERIALS INC107 citations95
BARDROFF MICHAEL
2 patentsBASF AG
2 patentsHUBER WALTER
2 patentsHASSLER ANDREAS
1 patentJOHANNAS HEIDENHAIN GMBH DR
1 patentROCHE DIAGNOSTICS CORP
1 patentJOHANNES HIEDENHEIN GMBH DR
1 patentBOHRMANN BERND
1 patentCIBA GEIGY CORP
1 patentDAIMLER CHRYSLER AG
1 patentSUMCO PHOENIX CORP
1 patentSIEMENS AG
1 patentITT MFG ENTERPRISES INC
1 patentGMBH JOHANNES HEIDENHAIN
1 patentJOERGER RALPH
1 patentITT
1 patentROCHE DIAGNOSTIC SYSTEMS INC
1 patentLOETSCHER HANSRUEDI
1 patentMANNESMANN AG
1 patentShowing the top 50 of 55 patents by PatentIndex Score.