P

Inventor

MAEHARA HIROSHI

JP44 patents
⚠️ This page may combine multiple inventors who share the name “MAEHARA HIROSHI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

CANON KK

40 patents
US6317479B1Nov 13, 2001

X-ray mask, and exposure method and apparatus using the same

CANON KK75 citations96
US5553110ASep 3, 1996

X-ray mask structure, process for production thereof, apparatus and method for X-ray exposure with the X-ray mask structure, and semiconductor device produced by the X-ray exposure method

CANON KK63 citations96
US6603128B2Aug 5, 2003

Charged-particle beam exposure apparatus and device manufacturing method

CANON KK32 citations93
US6594012B2Jul 15, 2003

Exposure apparatus

CANON KK32 citations93
US6476968B1Nov 5, 2002

Optical element

CANON KK18 citations93
US6317274B1Nov 13, 2001

Optical element

CANON KK18 citations93
US5593800AJan 14, 1997

Mask manufacturing method and apparatus and device manufacturing method using a mask manufactured by the method or apparatus

CANON KK52 citations93
US7019043B2Mar 28, 2006

Decomposable resin composition and method for producing the same

CANON KK15 citations92
US6728332B2Apr 27, 2004

X-ray mask, and exposure method and apparatus using the same

CANON KK20 citations92
US6479212B1Nov 12, 2002

Photosensitive resin, resist composition using the photosensitive resin, pattern formation method using the resist composition, device produced by the pattern formation method, and exposure method

CANON KK18 citations92
US6337161B2Jan 8, 2002

Mask structure exposure method

CANON KK26 citations92
US6225019B1May 1, 2001

Photosensitive resin, resist based on the photosensitive resin, exposure apparatus and exposure method using the resist, and semiconductor device obtained by the exposure method

CANON KK27 citations92
US6101237AAug 8, 2000

X-ray mask and X-ray exposure method using the same

CANON KK45 citations92
US6008942ADec 28, 1999

Diffractive optical element and optical instrument having the same

CANON KK23 citations92
US5889758AMar 30, 1999

Reflection type mask structure and exposure apparatus using the same

CANON KK21 citations92
US5800949ASep 1, 1998

Mask, method of producing a device using the mask and aligner with the mask

CANON KK25 citations92
US5485495AJan 16, 1996

X-ray mask, and exposure apparatus and device production using the mask

CANON KK34 citations92
US5469489ANov 21, 1995

Production method of an x-ray mask structure, an x-ray mask structure produced thereby, and a device fabricated by using the x-ray mask structure

CANON KK26 citations92
US7072438B2Jul 4, 2006

Reflection type mask

CANON KK5 citations74
US6872952B2Mar 29, 2005

Electron optical system array, method of manufacturing the same, charged-particle beam exposure apparatus, and device manufacturing method

CANON KK8 citations74
US6829091B2Dec 7, 2004

Optical system and optical instrument with diffractive optical element

CANON KK11 citations74
US6795166B2Sep 21, 2004

Illuminator, exposure apparatus, and method for fabricating device using the same

CANON KK8 citations74
US6653364B2Nov 25, 2003

Decomposable resin composition and method for producing the same

CANON KK7 citations74
US6652781B2Nov 25, 2003

Method for manufacture of optical element

CANON KK6 citations74
US6421188B1Jul 16, 2002

Optical element

CANON KK12 citations74
US5952149ASep 14, 1999

Resist solution for photolithography including a base resin and an oxygen-free or low-oxygen solvent

CANON KK13 citations74
US5882826AMar 16, 1999

Membrane and mask, and exposure apparatus using the mask, and device producing method using the mask

CANON KK8 citations74
US5870448AFeb 9, 1999

X-ray mask and fabrication process using it

CANON KK8 citations74
US5733688AMar 31, 1998

Lithographic mask structure and method of producing the same comprising W and molybdenum alloy absorber

CANON KK10 citations74
US5375157ADec 20, 1994

X-ray mask structure and a production method thereof, an exposure method using the X-ray mask structure, and a device fabricated by using the X-ray mask structure

CANON KK13 citations74
US5224139AJun 29, 1993

X-ray mask and semiconductor device manufacturing method using the same

CANON KK7 citations74
US7295357B2Nov 13, 2007

Apparatus for handling minute object

CANON KK2 citations63
US7122297B2Oct 17, 2006

Photosensitive resin composition, resist composition, fabrication method for patterned substrate, and device

CANON KK2 citations63
US7064113B2Jun 20, 2006

Resin composition, method of molding the same, and method of recycling resin composition

CANON KK4 citations63
US6866973B2Mar 15, 2005

Photosensitive resin composition, resist composition, fabricating method for patterned substrate, and device

CANON KK4 citations63
US6087076AJul 11, 2000

Method of manufacturing semiconductor devices by performing coating, heating, exposing and developing in a low-oxygen or oxygen free controlled environment

CANON KK3 citations63
US5861603AJan 19, 1999

Mask structure and method of making the same

CANON KK6 citations63
US7291679B2Nov 6, 2007

Recyclable polymer and process for production thereof

CANON KK4 citations62
US7608593B2Oct 27, 2009

Resin composition with biodegradable non-liquid-crystalline and liquid-crystalline polymers

CANON KK0 citations52
US7009007B2Mar 7, 2006

Recyclable polymer, process for production thereof, and recycling treatment thereof

CANON KK0 citations52

CHISSO CORP

2 patents

MAEHARA HIROSHI

1 patent

HITACHI CONSUMER ELECTRONICS

1 patent