P

Inventor

ANG TING CHEONG

SG49 patents
⚠️ This page may combine multiple inventors who share the name “ANG TING CHEONG”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

CHARTERED SEMICONDUCTOR MFG

38 patents
US6492726B1Dec 10, 2002

Chip scale packaging with multi-layer flip chip arrangement and ball grid array interconnection

CHARTERED SEMICONDUCTOR MFG267 citations99
US6252290B1Jun 26, 2001

Method to form, and structure of, a dual damascene interconnect device

CHARTERED SEMICONDUCTOR MFG123 citations98
US6406975B1Jun 18, 2002

Method for fabricating an air gap shallow trench isolation (STI) structure

CHARTERED SEMICONDUCTOR MFG84 citations97
US6380106B1Apr 30, 2002

Method for fabricating an air gap metallization scheme that reduces inter-metal capacitance of interconnect structures

CHARTERED SEMICONDUCTOR MFG84 citations97
US6611024B2Aug 26, 2003

Method of forming PID protection diode for SOI wafer

CHARTERED SEMICONDUCTOR MFG44 citations96
US6110787AAug 29, 2000

Method for fabricating a MOS device

CHARTERED SEMICONDUCTOR MFG99 citations96
US6261917B1Jul 17, 2001

High-K MOM capacitor

CHARTERED SEMICONDUCTOR MFG78 citations95
US6787422B2Sep 7, 2004

Method of body contact for SOI mosfet

CHARTERED SEMICONDUCTOR MFG20 citations93
US6376379B1Apr 23, 2002

Method of hard mask patterning

CHARTERED SEMICONDUCTOR MFG25 citations93
US6303414B1Oct 16, 2001

Method of forming PID protection diode for SOI wafer

CHARTERED SEMICONDUCTOR MFG42 citations93
US6275089B1Aug 14, 2001

Low voltage controllable transient trigger network for ESD protection

CHARTERED SEMICONDUCTOR MFG45 citations93
US6177324B1Jan 23, 2001

ESD protection device for STI deep submicron technology

CHARTERED SEMICONDUCTOR MFG42 citations93
US6649517B2Nov 18, 2003

Copper metal structure for the reduction of intra-metal capacitance

CHARTERED SEMICONDUCTOR MFG31 citations92
US6319783B1Nov 20, 2001

Process to fabricate a novel source-drain extension

CHARTERED SEMICONDUCTOR MFG16 citations92
US6284609B1Sep 4, 2001

Method to fabricate a MOSFET using selective epitaxial growth to form lightly doped source/drain regions

CHARTERED SEMICONDUCTOR MFG22 citations92
US6248618B1Jun 19, 2001

Method of fabrication of dual gate oxides for CMOS devices

CHARTERED SEMICONDUCTOR MFG22 citations92
US6090691AJul 18, 2000

Method for forming a raised source and drain without using selective epitaxial growth

CHARTERED SEMICONDUCTOR MFG46 citations92
US6406994B1Jun 18, 2002

Triple-layered low dielectric constant dielectric dual damascene approach

CHARTERED SEMICONDUCTOR MFG31 citations91
US6406948B1Jun 18, 2002

Method for forming an ESD protection network for SOI technology with the ESD device formed in an underlying silicon substrate

CHARTERED SEMICONDUCTOR MFG33 citations91
US6300172B1Oct 9, 2001

Method of field isolation in silicon-on-insulator technology

CHARTERED SEMICONDUCTOR MFG22 citations91
US6214680B1Apr 10, 2001

Method to fabricate a sub-quarter-micron MOSFET with lightly doped source/drain regions

CHARTERED SEMICONDUCTOR MFG22 citations89
US6963113B2Nov 8, 2005

Method of body contact for SOI MOSFET

CHARTERED SEMICONDUCTOR MFG13 citations84
US6815823B2Nov 9, 2004

Copper metal structure for the reduction of intra-metal capacitance

CHARTERED SEMICONDUCTOR MFG13 citations84
US6582856B1Jun 24, 2003

Simplified method of fabricating a rim phase shift mask

CHARTERED SEMICONDUCTOR MFG13 citations84
US6465296B1Oct 15, 2002

Vertical source/drain contact semiconductor

CHARTERED SEMICONDUCTOR MFG14 citations83
US6416909B1Jul 9, 2002

Alternating phase shift mask and method for fabricating the alignment monitor

CHARTERED SEMICONDUCTOR MFG16 citations81
US6376319B2Apr 23, 2002

Process to fabricate a source-drain extension

CHARTERED SEMICONDUCTOR MFG13 citations74
US6653674B2Nov 25, 2003

Vertical source/drain contact semiconductor

CHARTERED SEMICONDUCTOR MFG11 citations73
US6764914B2Jul 20, 2004

Method of forming a high K metallic dielectric layer

CHARTERED SEMICONDUCTOR MFG6 citations72
US6492242B1Dec 10, 2002

Method of forming of high K metallic dielectric layer

CHARTERED SEMICONDUCTOR MFG8 citations72
US6486515B2Nov 26, 2002

ESD protection network used for SOI technology

CHARTERED SEMICONDUCTOR MFG9 citations72
US6495399B1Dec 17, 2002

Method of vacuum packaging a semiconductor device assembly

CHARTERED SEMICONDUCTOR MFG7 citations71
US6329253B1Dec 11, 2001

Thick oxide MOS device used in ESD protection circuit

CHARTERED SEMICONDUCTOR MFG9 citations71
US6143598ANov 7, 2000

Method of fabrication of low leakage capacitor

CHARTERED SEMICONDUCTOR MFG15 citations70
US6455384B2Sep 24, 2002

Method for forming MOSFET device having source/drain extension regions located underlying L shaped spacers

CHARTERED SEMICONDUCTOR MFG4 citations63
US6399431B1Jun 4, 2002

ESD protection device for SOI technology

CHARTERED SEMICONDUCTOR MFG3 citations63
US6803314B2Oct 12, 2004

Double-layered low dielectric constant dielectric dual damascene method

CHARTERED SEMICONDUCTOR MFG5 citations57
US6737739B2May 18, 2004

Method of vacuum packaging a semiconductor device assembly

CHARTERED SEMICONDUCTOR MFG0 citations49

SEMICONDUCTOR MFG INT SHANGHAI

5 patents

ANG TING CHEONG

4 patents

CHARTERED SEMINCONDUCTOR MFG L

1 patent

DENSELIGHT SEMICONDUCTOR PTE L

1 patent