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Inventor
HAHN LOREN L
US
2 patents
Patents
2 patents
US7835564B2
Nov 16, 2010
Non-destructive, below-surface defect rendering using image intensity analysis
IBM
2 citations
49
US7867910B2
Jan 11, 2011
Method of accessing semiconductor circuits from the backside using ion-beam and gas-etch
IBM
0 citations
46