Inventor

KUO TSUN-EN

TW3 patents

Patents

3 patents

US10692754B2Jun 23, 2020

Device and method for contact state inspection

TAIWAN SEMICONDUCTOR MFG CO LTD3 citations67

US12181362B2Dec 31, 2024

Device and method for pressure force inspection

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations56

US11187602B2Nov 30, 2021

Device and method for pressure force inspection

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations56