Inventor
THEAN VOON-YEW
US57 patents
⚠️ This page may combine multiple inventors who share the name “THEAN VOON-YEW”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
FREESCALE SEMICONDUCTOR INC
42 patentsUS7226833B2Jun 5, 2007
Semiconductor device structure and method therefor
FREESCALE SEMICONDUCTOR INC124 citations99
US7282402B2Oct 16, 2007
Method of making a dual strained channel semiconductor device
FREESCALE SEMICONDUCTOR INC69 citations97
US7018901B1Mar 28, 2006
Method for forming a semiconductor device having a strained channel and a heterojunction source/drain
FREESCALE SEMICONDUCTOR INC105 citations97
US7585735B2Sep 8, 2009
Asymmetric spacers and asymmetric source/drain extension layers
FREESCALE SEMICONDUCTOR INC33 citations93
US7575975B2Aug 18, 2009
Method for forming a planar and vertical semiconductor structure having a strained semiconductor layer
FREESCALE SEMICONDUCTOR INC34 citations93
US7323389B2Jan 29, 2008
Method of forming a FINFET structure
FREESCALE SEMICONDUCTOR INC23 citations93
US7226820B2Jun 5, 2007
Transistor fabrication using double etch/refill process
FREESCALE SEMICONDUCTOR INC34 citations93
US7037795B1May 2, 2006
Low RC product transistors in SOI semiconductor process
FREESCALE SEMICONDUCTOR INC26 citations93
US7208357B2Apr 24, 2007
Template layer formation
FREESCALE SEMICONDUCTOR INC18 citations92
US7091071B2Aug 15, 2006
Semiconductor fabrication process including recessed source/drain regions in an SOI wafer
FREESCALE SEMICONDUCTOR INC22 citations92
US7067868B2Jun 27, 2006
Double gate device having a heterojunction source/drain and strained channel
FREESCALE SEMICONDUCTOR INC39 citations92
US7029980B2Apr 18, 2006
Method of manufacturing SOI template layer
FREESCALE SEMICONDUCTOR INC25 citations92
US6979622B1Dec 27, 2005
Semiconductor transistor having structural elements of differing materials and method of formation
FREESCALE SEMICONDUCTOR INC21 citations92
US7736957B2Jun 15, 2010
Method of making a semiconductor device with embedded stressor
FREESCALE SEMICONDUCTOR INC20 citations90
US7803670B2Sep 28, 2010
Twisted dual-substrate orientation (DSO) substrates
FREESCALE SEMICONDUCTOR INC19 citations84
US7763510B1Jul 27, 2010
Method for PFET enhancement
FREESCALE SEMICONDUCTOR INC9 citations84
US7230264B2Jun 12, 2007
Semiconductor transistor having structural elements of differing materials
FREESCALE SEMICONDUCTOR INC14 citations84
US7205210B2Apr 17, 2007
Semiconductor structure having strained semiconductor and method therefor
FREESCALE SEMICONDUCTOR INC16 citations84
US7160769B2Jan 9, 2007
Channel orientation to enhance transistor performance
FREESCALE SEMICONDUCTOR INC10 citations84
US7883953B2Feb 8, 2011
Method for transistor fabrication with optimized performance
FREESCALE SEMICONDUCTOR INC7 citations83
US7282415B2Oct 16, 2007
Method for making a semiconductor device with strain enhancement
FREESCALE SEMICONDUCTOR INC17 citations82
US7821067B2Oct 26, 2010
Electronic devices including a semiconductor layer
FREESCALE SEMICONDUCTOR INC11 citations81
US7265004B2Sep 4, 2007
Electronic devices including a semiconductor layer and a process for forming the same
FREESCALE SEMICONDUCTOR INC15 citations81
US7112455B2Sep 26, 2006
Semiconductor optical devices and method for forming
FREESCALE SEMICONDUCTOR INC10 citations74
US7659156B2Feb 9, 2010
Method to selectively modulate gate work function through selective Ge condensation and high-K dielectric layer
FREESCALE SEMICONDUCTOR INC5 citations72
US7235502B2Jun 26, 2007
Transitional dielectric layer to improve reliability and performance of high dielectric constant transistors
FREESCALE SEMICONDUCTOR INC8 citations72
US7056778B2Jun 6, 2006
Semiconductor layer formation
FREESCALE SEMICONDUCTOR INC7 citations72
US8039341B2Oct 18, 2011
Selective uniaxial stress modification for use with strained silicon on insulator integrated circuit
FREESCALE SEMICONDUCTOR INC6 citations63
US8003454B2Aug 23, 2011
CMOS process with optimized PMOS and NMOS transistor devices
FREESCALE SEMICONDUCTOR INC3 citations63
US7960243B2Jun 14, 2011
Method of forming a semiconductor device featuring a gate stressor and semiconductor device
FREESCALE SEMICONDUCTOR INC4 citations63
US7781839B2Aug 24, 2010
Structure and method for strained transistor directly on insulator
FREESCALE SEMICONDUCTOR INC2 citations63
US7781277B2Aug 24, 2010
Selective uniaxial stress relaxation by layout optimization in strained silicon on insulator integrated circuit
FREESCALE SEMICONDUCTOR INC3 citations63
US7781840B2Aug 24, 2010
Semiconductor device structure
FREESCALE SEMICONDUCTOR INC4 citations63
US7737018B2Jun 15, 2010
Process of forming an electronic device including forming a gate electrode layer and forming a patterned masking layer
FREESCALE SEMICONDUCTOR INC4 citations63
US7615806B2Nov 10, 2009
Method for forming a semiconductor structure and structure thereof
FREESCALE SEMICONDUCTOR INC6 citations63
US7521720B2Apr 21, 2009
Semiconductor optical devices having fin structures
FREESCALE SEMICONDUCTOR INC4 citations63
US7494832B2Feb 24, 2009
Semiconductor optical devices and method for forming
FREESCALE SEMICONDUCTOR INC1 citations63
US7241647B2Jul 10, 2007
Graded semiconductor layer
FREESCALE SEMICONDUCTOR INC5 citations63
US7700420B2Apr 20, 2010
Integrated circuit with different channel materials for P and N channel transistors and method therefor
FREESCALE SEMICONDUCTOR INC3 citations62
US7556992B2Jul 7, 2009
Method for forming vertical structures in a semiconductor device
FREESCALE SEMICONDUCTOR INC6 citations62
US7468313B2Dec 23, 2008
Engineering strain in thick strained-SOI substrates
FREESCALE SEMICONDUCTOR INC2 citations62
US7208424B2Apr 24, 2007
Method of forming a semiconductor device having a metal layer
FREESCALE SEMICONDUCTOR INC6 citations62
IMEC VZW
2 patentsIMEC
2 patentsIBM
1 patentWINSTEAD BRIAN A
1 patentLI WEIPENG
1 patentSADAKA MARIAM G
1 patentShowing the top 50 of 57 patents by PatentIndex Score.