Inventor
WHITE TED R
US43 patents
⚠️ This page may combine multiple inventors who share the name “WHITE TED R”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
FREESCALE SEMICONDUCTOR INC
34 patentsUS7226833B2Jun 5, 2007
Semiconductor device structure and method therefor
FREESCALE SEMICONDUCTOR INC124 citations99
US6838322B2Jan 4, 2005
Method for forming a double-gated semiconductor device
FREESCALE SEMICONDUCTOR INC259 citations98
US7282402B2Oct 16, 2007
Method of making a dual strained channel semiconductor device
FREESCALE SEMICONDUCTOR INC69 citations97
US7018901B1Mar 28, 2006
Method for forming a semiconductor device having a strained channel and a heterojunction source/drain
FREESCALE SEMICONDUCTOR INC105 citations97
US6831350B1Dec 14, 2004
Semiconductor structure with different lattice constant materials and method for forming the same
FREESCALE SEMICONDUCTOR INC89 citations97
US7494856B2Feb 24, 2009
Semiconductor fabrication process using etch stop layer to optimize formation of source/drain stressor
FREESCALE SEMICONDUCTOR INC51 citations94
US7524707B2Apr 28, 2009
Modified hybrid orientation technology
FREESCALE SEMICONDUCTOR INC19 citations93
US7288458B2Oct 30, 2007
SOI active layer with different surface orientation
FREESCALE SEMICONDUCTOR INC21 citations93
US7226820B2Jun 5, 2007
Transistor fabrication using double etch/refill process
FREESCALE SEMICONDUCTOR INC34 citations93
US7074664B1Jul 11, 2006
Dual metal gate electrode semiconductor fabrication process and structure thereof
FREESCALE SEMICONDUCTOR INC49 citations93
US7037795B1May 2, 2006
Low RC product transistors in SOI semiconductor process
FREESCALE SEMICONDUCTOR INC26 citations93
US7208357B2Apr 24, 2007
Template layer formation
FREESCALE SEMICONDUCTOR INC18 citations92
US7067868B2Jun 27, 2006
Double gate device having a heterojunction source/drain and strained channel
FREESCALE SEMICONDUCTOR INC39 citations92
US7029980B2Apr 18, 2006
Method of manufacturing SOI template layer
FREESCALE SEMICONDUCTOR INC25 citations92
US7803670B2Sep 28, 2010
Twisted dual-substrate orientation (DSO) substrates
FREESCALE SEMICONDUCTOR INC19 citations84
US7205210B2Apr 17, 2007
Semiconductor structure having strained semiconductor and method therefor
FREESCALE SEMICONDUCTOR INC16 citations84
US7163903B2Jan 16, 2007
Method for making a semiconductor structure using silicon germanium
FREESCALE SEMICONDUCTOR INC10 citations84
US7160769B2Jan 9, 2007
Channel orientation to enhance transistor performance
FREESCALE SEMICONDUCTOR INC10 citations84
US7821067B2Oct 26, 2010
Electronic devices including a semiconductor layer
FREESCALE SEMICONDUCTOR INC11 citations81
US7265004B2Sep 4, 2007
Electronic devices including a semiconductor layer and a process for forming the same
FREESCALE SEMICONDUCTOR INC15 citations81
US7056778B2Jun 6, 2006
Semiconductor layer formation
FREESCALE SEMICONDUCTOR INC7 citations72
US7749829B2Jul 6, 2010
Step height reduction between SOI and EPI for DSO and BOS integration
FREESCALE SEMICONDUCTOR INC7 citations71
US7923328B2Apr 12, 2011
Split gate non-volatile memory cell with improved endurance and method therefor
FREESCALE SEMICONDUCTOR INC2 citations63
US7799644B2Sep 21, 2010
Transistor with asymmetry for data storage circuitry
FREESCALE SEMICONDUCTOR INC3 citations63
US7781840B2Aug 24, 2010
Semiconductor device structure
FREESCALE SEMICONDUCTOR INC4 citations63
US7544548B2Jun 9, 2009
Trench liner for DSO integration
FREESCALE SEMICONDUCTOR INC6 citations63
US7479422B2Jan 20, 2009
Semiconductor device with stressors and method therefor
FREESCALE SEMICONDUCTOR INC2 citations63
US7402477B2Jul 22, 2008
Method of making a multiple crystal orientation semiconductor device
FREESCALE SEMICONDUCTOR INC4 citations63
US7241647B2Jul 10, 2007
Graded semiconductor layer
FREESCALE SEMICONDUCTOR INC5 citations63
US7700420B2Apr 20, 2010
Integrated circuit with different channel materials for P and N channel transistors and method therefor
FREESCALE SEMICONDUCTOR INC3 citations62
US7556992B2Jul 7, 2009
Method for forming vertical structures in a semiconductor device
FREESCALE SEMICONDUCTOR INC6 citations62
US7927956B2Apr 19, 2011
Method for making a semiconductor structure using silicon germanium
FREESCALE SEMICONDUCTOR INC0 citations52
US7923769B2Apr 12, 2011
Split gate non-volatile memory cell with improved endurance and method therefor
FREESCALE SEMICONDUCTOR INC1 citations52
US7811382B2Oct 12, 2010
Method for forming a semiconductor structure having a strained silicon layer
FREESCALE SEMICONDUCTOR INC1 citations52
MOTOROLA INC
3 patentsUS5918147AJun 29, 1999
Process for forming a semiconductor device with an antireflective layer
MOTOROLA INC89 citations95
US5589423ADec 31, 1996
Process for fabricating a non-silicided region in an integrated circuit
MOTOROLA INC55 citations92
US4902533AFeb 20, 1990
Method for selectively depositing tungsten on a substrate by using a spin-on metal oxide
MOTOROLA INC39 citations87