Inventor

WEI ALEXANDER C

US2 patents

⚠️ This page may combine multiple inventors who share the name “WEI ALEXANDER C”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

ABDO AMR Y

1 patent

US8234601B2Jul 31, 2012

Test pattern for contour calibration in OPC model build

ABDO AMR Y2 citations53

IBM

1 patent

US7765518B2Jul 27, 2010

System and method for implementing optical rule checking to identify and quantify corner rounding errors

IBM2 citations50