Inventor · disambiguated record
Jung-Mu Lee
Also filed as: LEE JUNG-MU
1 granted patent·1 pending application·0 citations·filing 2003–2007
8Inventor score
Files withSAMSUNG ELECTRONICS CO LTD2
Top patents by PatentIndex Score
2 records- 0128US6942497B2Socket assembly for test of integrated circuit, and its integrated circuit and testerSAMSUNG ELECTRONICS CO LTD·Filed 2003·Granted Sep 13, 2005·0 cites·21 claims
- 0226US2008136429A1Probe card of semiconductor test apparatus and method of fabricating the sameSAMSUNG ELECTRONICS CO LTD·Filed 2007·Application pending·0 cites
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →