Inventor
LIAO HONG
SG19 patents
⚠️ This page may combine multiple inventors who share the name “LIAO HONG”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
UNITED MICROELECTRONICS CORP
15 patentsUS9331200B1May 3, 2016
Semiconductor device and method for fabricating the same
UNITED MICROELECTRONICS CORP397 citations97
US9859290B1Jan 2, 2018
Memory device and method for fabricating the same
UNITED MICROELECTRONICS CORP20 citations94
US9728260B1Aug 8, 2017
Light-erasable embedded memory device and method of manufacturing the same
UNITED MICROELECTRONICS CORP9 citations83
US9911847B1Mar 6, 2018
Non-volatile memory device and manufacturing method thereof
UNITED MICROELECTRONICS CORP13 citations82
US9607123B2Mar 28, 2017
Method for performing deep n-typed well-correlated (DNW-correlated) antenna rule check of integrated circuit and semiconductor structure complying with DNW-correlated antenna rule
UNITED MICROELECTRONICS CORP2 citations71
US9496390B2Nov 15, 2016
Vertical transistor device with halo pocket contacting source
UNITED MICROELECTRONICS CORP4 citations71
US8890084B1Nov 18, 2014
Method for analyzing circuit pattern
UNITED MICROELECTRONICS CORP4 citations71
US9966465B1May 8, 2018
Non-volatile memory device
UNITED MICROELECTRONICS CORP5 citations68
US9922832B1Mar 20, 2018
Manufacturing method of semiconductor structure
UNITED MICROELECTRONICS CORP5 citations67
US9847351B2Dec 19, 2017
Semiconductor device and method for fabricating the same
UNITED MICROELECTRONICS CORP0 citations52
US10079204B2Sep 18, 2018
Light-erasable embedded memory device and method of manufacturing the same
UNITED MICROELECTRONICS CORP0 citations51
US9209344B2Dec 8, 2015
Method for forming doping region and method for forming MOS
UNITED MICROELECTRONICS CORP0 citations50
US12525460B2Jan 13, 2026
Method of manufacturing semiconductor structure including removing hard mask layer and dielectric material layer exposed by patterned photoresist layer
UNITED MICROELECTRONICS CORP0 citations47
US7989804B2Aug 2, 2011
Test pattern structure
UNITED MICROELECTRONICS CORP0 citations44
US10147806B1Dec 4, 2018
Method of fabricating floating gates
UNITED MICROELECTRONICS CORP0 citations38