P

Inventor

KULKARNI ASHOK V

US14 patents
⚠️ This page may combine multiple inventors who share the name “KULKARNI ASHOK V”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

KLA TENCOR CORP

7 patents
US9098891B2Aug 4, 2015

Adaptive sampling for semiconductor inspection recipe creation, defect review, and metrology

KLA TENCOR CORP27 citations92
US7440607B1Oct 21, 2008

Outlier substrate inspection

KLA TENCOR CORP45 citations89
US9401016B2Jul 26, 2016

Using high resolution full die image data for inspection

KLA TENCOR CORP15 citations83
US9262821B2Feb 16, 2016

Inspection recipe setup from reference image variation

KLA TENCOR CORP8 citations83
US9224660B2Dec 29, 2015

Tuning wafer inspection recipes using precise defect locations

KLA TENCOR CORP7 citations83
US9767548B2Sep 19, 2017

Outlier detection on pattern of interest image populations

KLA TENCOR CORP1 citations51
US10706522B2Jul 7, 2020

System and method for generation of wafer inspection critical areas

KLA TENCOR CORP0 citations47

KULKARNI ASHOK V

3 patents
US8600143B1Dec 3, 2013

Method and system for hierarchical tissue analysis and classification

KULKARNI ASHOK V46 citations93
US8781781B2Jul 15, 2014

Dynamic care areas

KULKARNI ASHOK V20 citations90
US9170211B2Oct 27, 2015

Design-based inspection using repeating structures

KULKARNI ASHOK V5 citations71

KLA INSTR CORP

1 patent
US5991699ANov 23, 1999

Detecting groups of defects in semiconductor feature space

KLA INSTR CORP435 citations95

COULTER ELECTRONICS

1 patent
US4183013AJan 8, 1980

System for extracting shape features from an image

COULTER ELECTRONICS260 citations94

KLA TENCOR TECH CORP

1 patent
US6985220B1Jan 10, 2006

Interactive threshold tuning

KLA TENCOR TECH CORP26 citations88

KLA CORP

1 patent
US11410291B2Aug 9, 2022

System and method for generation of wafer inspection critical areas

KLA CORP0 citations57