Inventor

BHASKAR KRIS

US31 patents

⚠️ This page may combine multiple inventors who share the name “BHASKAR KRIS”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

BHASKAR KRIS

KLA TENCOR CORP

Generalized virtual inspector

Systems and methods incorporating a neural network and a forward physical model for semiconductor applications

Generating simulated output for a specimen

Generating simulated images from design information

Acquisition of information for a construction site

Accelerating semiconductor-related computations using learning based models

Image based specimen process control

Methods for generating a standard reference die for use in a die to standard reference die inspection and methods for inspecting a wafer

Accelerated training of a machine learning based model for semiconductor applications

Generating simulated images from input images for semiconductor applications

Hybrid inspectors

Inspection recipe setup from reference image variation

Active learning for defect classifier training

Training a neural network for defect detection in low resolution images

Single image detection

Detecting defects on a wafer

Generating high resolution images from low resolution images for semiconductor applications

Method and system for universal target based inspection and metrology

Diagnostic systems and methods for deep learning models configured for semiconductor applications

Virtual inspection systems for process window characterization

KLA CORP

Learnable defect detection for semiconductor applications

Multi-controller inspection system

Mode selection and defect detection training

3D structure inspection or metrology using deep learning

Deep learning based mode selection for inspection

BHASKAR KRIS

Systems and methods for creating persistent data for a wafer and for using persistent data for inspection-related functions

Methods for generating a standard reference die for use in a die to standard reference die inspection and methods for inspecting a wafer

KIRK MICHAEL D

Methods and systems for determining a characteristic of a wafer

Methods and systems for determining a characteristic of a wafer

ZHAO GUOHENG

Dark field inspection system with ring illumination

KLA TENCOR TECH CORP

Apparatus and methods for analyzing defects on a sample