Inventor
LEE TSUNG-HSIEN
TW24 patents
⚠️ This page may combine multiple inventors who share the name “LEE TSUNG-HSIEN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TAIWAN SEMICONDUCTOR MFG CO LTD
19 patentsUS11810945B2Nov 7, 2023
Trench capacitor and method of forming the same
TAIWAN SEMICONDUCTOR MFG CO LTD3 citations72
US10868107B2Dec 15, 2020
Trench capacitor and method of forming the same
TAIWAN SEMICONDUCTOR MFG CO LTD3 citations72
US10804206B2Oct 13, 2020
Deep trench protection
TAIWAN SEMICONDUCTOR MFG CO LTD3 citations72
US10115679B1Oct 30, 2018
Trench structure and method
TAIWAN SEMICONDUCTOR MFG CO LTD4 citations72
US9972771B2May 15, 2018
MRAM devices and methods of forming the same
TAIWAN SEMICONDUCTOR MFG CO LTD3 citations72
US9556015B1Jan 31, 2017
Substrate structure, semiconductor structure and method for fabricating the same
TAIWAN SEMICONDUCTOR MFG CO LTD3 citations72
US9647022B2May 9, 2017
Multi-layer structure for high aspect ratio etch
TAIWAN SEMICONDUCTOR MFG CO LTD5 citations71
US9703919B2Jul 11, 2017
System and method of filtering actual defects from defect information for a wafer
TAIWAN SEMICONDUCTOR MFG CO LTD3 citations68
US12444688B2Oct 14, 2025
Deep trench protection
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US12419064B2Sep 16, 2025
Trench capacitor
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11373952B2Jun 28, 2022
Deep trench protection
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11131541B2Sep 28, 2021
Shutter monitoring system
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations61
US9117765B2Aug 25, 2015
Mechanism for forming semiconductor device structure
TAIWAN SEMICONDUCTOR MFG CO LTD1 citations52
US10508020B2Dec 17, 2019
Substrate structure, semiconductor structure and method for fabricating the same
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations51
US10424549B2Sep 24, 2019
Trench structure and method
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations51
US9673200B2Jun 6, 2017
Semiconductor device structure and method of manufacturing the same
TAIWAN SEMICONDUCTOR MFG CO LTD1 citations47
US9257438B2Feb 9, 2016
Semiconductor device structure and method of manufacturing the same
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations47
US9188547B2Nov 17, 2015
Defect inspection apparatus and method
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations43
US9659874B2May 23, 2017
Method of forming deep trench and deep trench isolation structure
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations40