Inventor
YAMAMURA TOSHIO
JP34 patents
⚠️ This page may combine multiple inventors who share the name “YAMAMURA TOSHIO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TOSHIBA KK
19 patentsUS7023741B2Apr 4, 2006
Semiconductor integrated circuit adapted to output pass/fail results of internal operations
TOSHIBA KK18 citations96
US6512702B1Jan 28, 2003
Non-volatile semiconductor memory device and data erase controlling method for use therein
TOSHIBA KK62 citations96
US6122193ASep 19, 2000
Non-volatile semiconductor memory capable of storing 1-bit data or multi-bit data
TOSHIBA KK82 citations96
US5682346AOct 28, 1997
Nonvolatile semiconductor memory device having suitable writing efficiency
TOSHIBA KK71 citations96
US5371702ADec 6, 1994
Block erasable nonvolatile memory device
TOSHIBA KK89 citations96
US7916555B2Mar 29, 2011
Semiconductor integrated circuit adapted to output pass/fail results of internal operations
TOSHIBA KK7 citations93
US6418052B1Jul 9, 2002
Nonvolatile semiconductor memory equipped with data latch circuits for transferring one-bit data or multi-bit data
TOSHIBA KK19 citations93
US6331945B1Dec 18, 2001
Non-volatile semiconductor memory capable of storing one-bit data or multi-bit data
TOSHIBA KK24 citations93
US5969557AOct 19, 1999
Delay circuit, oscillation circuit and semiconductor memory device
TOSHIBA KK36 citations93
US5627488AMay 6, 1997
Delay circuit, oscillation circuit and semiconductor memory device
TOSHIBA KK44 citations93
US5615148AMar 25, 1997
Nonvolatile semiconductor memory
TOSHIBA KK23 citations93
US5436913AJul 25, 1995
Non-volatile semiconductor memory device using successively longer write pulses
TOSHIBA KK38 citations93
US7453739B2Nov 18, 2008
Semiconductor integrated circuit adapted to output pass/fail results of internal operations
TOSHIBA KK7 citations82
US7224621B2May 29, 2007
Semiconductor integrated circuit adapted to output pass/fail results of internal operations
TOSHIBA KK4 citations74
US7123515B2Oct 17, 2006
Semiconductor integrated circuit adapted to output pass/fail results of internal operations
TOSHIBA KK3 citations74
US8743625B2Jun 3, 2014
Semiconductor integrated circuit adapted to output pass/fail results of internal operations
TOSHIBA KK0 citations63
US7894262B2Feb 22, 2011
Nonvolatile semiconductor storage device having guaranteed and backup blocks
TOSHIBA KK3 citations63
US9536610B2Jan 3, 2017
Semiconductor integrated circuit adapted to output pass/fail results of internal operations
TOSHIBA KK0 citations52
US7301834B2Nov 27, 2007
Semiconductor memory
TOSHIBA KK0 citations42
TOSHIBA MEMORY CORP
4 patentsUS10026491B2Jul 17, 2018
Semiconductor memory device and memory system
TOSHIBA MEMORY CORP11 citations82
US10741266B2Aug 11, 2020
Semiconductor integrated circuit adapted to output pass/fail results of internal operations
TOSHIBA MEMORY CORP0 citations63
US10410731B2Sep 10, 2019
Semiconductor integrated circuit adapted to output pass/fail results of internal operations
TOSHIBA MEMORY CORP0 citations63
US9870831B2Jan 16, 2018
Semiconductor integrated circuit adapted to output pass/fail results of internal operations
TOSHIBA MEMORY CORP1 citations63
TOKYO SHIBAURA ELECTRIC CO
3 patentsNAKAMURA HIROSHI
3 patentsUS8477541B2Jul 2, 2013
Semiconductor integrated circuit adapted to output pass/fail results of internal operations
NAKAMURA HIROSHI9 citations93
US8218373B2Jul 10, 2012
Semiconductor integrated circuit adapted to output pass/fail results of internal operations
NAKAMURA HIROSHI8 citations93
US8218374B2Jul 10, 2012
Semiconductor integrated circuit adapted to output pass/fail results of internal operations
NAKAMURA HIROSHI1 citations63