Inventor

RODKO DANIEL

US19 patents

⚠️ This page may combine multiple inventors who share the name “RODKO DANIEL”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

RODKO DANIEL

IBM

Array self repair using built-in self test techniques

Merged MISR and output register without performance impact for circuits under test

Merged MISR and output register without performance impact for circuits under test

Multi-match error detection in content addressable memory testing

Shift register with opposite shift data and shift clock directions

Testing content addressable memory and random access memory

Testing content addressable memory and random access memory

Testing content addressable memory and random access memory

Sequential error capture during memory test

Built-in self-test for bit-write enabled memory arrays

Power saving scannable latch output driver

Microchip level shared array repair

BIST address generation architecture for multi-port memories

Testing bit write operation to a memory array in integrated circuits

On-chip hardware-controlled window strobing

On-chip hardware-controlled window strobing

Partition-able storage of test results using inactive storage elements

Clock duty cycle based access timer combined with standard stage clocked output register

DUFFY KEVIN J

Memory testing system