P

Inventor

KURASAWA HIKARU

JP11 patents

Patents

11 patents
US9921201B2Mar 20, 2018

Calibration curve creating method and calibration curve creation apparatus

SEIKO EPSON CORP4 citations71
US11232597B2Jan 25, 2022

Information system and identification method

SEIKO EPSON CORP0 citations51
US11412161B2Aug 9, 2022

Image processing method, image processing device, and information system

SEIKO EPSON CORP0 citations50
US11079274B2Aug 3, 2021

Spectroscopic system

SEIKO EPSON CORP0 citations50
US12499344B2Dec 16, 2025

Method of executing classification process using machine learning model, information processing device, and non-transitory computer-readable medium storing computer program

SEIKO EPSON CORP0 citations49
US12449350B2Oct 21, 2025

Determination method

SEIKO EPSON CORP0 citations49
US12293578B2May 6, 2025

Object detection method, object detection apparatus, and non-transitory computer-readable storage medium storing computer program

SEIKO EPSON CORP0 citations48
US12277699B2Apr 15, 2025

Method for determining quality of inspection data using machine learning model, information processing apparatus, and non-transitory computer readable storage medium storing computer program

SEIKO EPSON CORP0 citations48
US11204314B2Dec 21, 2021

Calibration apparatus and calibration curve creation method

SEIKO EPSON CORP0 citations48
US10488329B2Nov 26, 2019

Calibration apparatus, calibration curve creation method, and independent component analysis method

SEIKO EPSON CORP0 citations40
US10852228B2Dec 1, 2020

Calibration apparatus, calibration curve creation method, and independent component analysis method

SEIKO EPSON CORP0 citations38