Inventor
HAN LUYANG
DE7 patents
Patents
7 patentsUS11501948B2Nov 15, 2022
Operating a particle beam device
ZEISS CARL MICROSCOPY GMBH0 citations59
US12394588B2Aug 19, 2025
Method of generating a crystalline orientation map of a surface portion of a sample and computer program product
ZEISS CARL MICROSCOPY GMBH0 citations56
US11092557B2Aug 17, 2021
Method for generating a result image
ZEISS CARL MICROSCOPY GMBH0 citations45
US10839491B2Nov 17, 2020
Method of recording an image using a particle microscope and particle microscope
ZEISS CARL MICROSCOPY GMBH0 citations38
US10615000B2Apr 7, 2020
Electron beam microscope
ZEISS CARL MICROSCOPY GMBH0 citations38
US10546716B2Jan 28, 2020
Method for operating a pressure system of a device for imaging, analyzing and/or processing an object and a device for carrying out the method
ZEISS CARL MICROSCOPY GMBH0 citations35
US10504691B2Dec 10, 2019
Method for generating a composite image of an object and particle beam device for carrying out the method
ZEISS CARL MICROSCOPY GMBH0 citations35