Inventor

HU DAWEI

CN20 patents

⚠️ This page may combine multiple inventors who share the name “HU DAWEI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

HU DAWEI

KLA CORP

Scatterometry based methods and systems for measurement of strain in semiconductor structures

Multi-environment polarized infrared reflectometer for semiconductor metrology

Scatterometry based methods and systems for measurement of strain in semiconductor structures

Bandgap measurements of patterned film stacks using spectroscopic metrology

Measurements of semiconductor structures based on spectral differences at different process steps

Dispersion model for band gap tracking

Multi-dimensional model of optical dispersion

CHINA PETROLEUM & CHEM CORP

Process for hydrotreating heavy raw oils

Process and system for hydrotreating deoiled asphalt

Process and system for processing aromatics-rich fraction oil

Hydrogenation catalyst and preparation method therefor and use thereof

KLA TENCOR CORP

Dispersion model for band gap tracking

Dispersion model for band gap tracking

Bandgap measurements of patterned film stacks using spectroscopic metrology

Measurement methodology of advanced nanostructures

INST ROCK & SOIL MECH CAS

Rock hollow cylinder torsional shear apparatus

Ring shear and seepage-coupled apparatus and ring shear and seepage-coupled test system for rock and rock fracture under tension or compression stress

Rock high-stress high-temperature micro-nano indentation test system

Combined rock-breaking TBM tunneling method in complex strata for realizing three-way force detection

ROLLS ROYCE PLC

Method of heat treating titanium aluminide