Inventor
KONDO NAOAKI
JP12 patents
⚠️ This page may combine multiple inventors who share the name “KONDO NAOAKI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
HITACHI HIGH TECH CORP
11 patentsUS10810733B2Oct 20, 2020
Defect classification apparatus and defect classification method
HITACHI HIGH TECH CORP5 citations72
US10559074B2Feb 11, 2020
Sample observation device and sample observation method
HITACHI HIGH TECH CORP2 citations72
US12260545B2Mar 25, 2025
Sample observation device and method
HITACHI HIGH TECH CORP1 citations62
US11170483B2Nov 9, 2021
Sample observation device and sample observation method
HITACHI HIGH TECH CORP1 citations62
US11087454B2Aug 10, 2021
Defect observation device and defect observation method
HITACHI HIGH TECH CORP1 citations62
US10971325B2Apr 6, 2021
Defect observation system and defect observation method for semiconductor wafer
HITACHI HIGH TECH CORP1 citations62
US11670528B2Jun 6, 2023
Wafer observation apparatus and wafer observation method
HITACHI HIGH TECH CORP0 citations51
US10977786B2Apr 13, 2021
Wafer observation device
HITACHI HIGH TECH CORP0 citations51
US12333695B2Jun 17, 2025
Sample observation system and image processing method
HITACHI HIGH TECH CORP0 citations50
US12154264B2Nov 26, 2024
Defect inspecting system and defect inspecting method
HITACHI HIGH TECH CORP0 citations50
US12564016B2Feb 24, 2026
Defect observation method, apparatus, and program
HITACHI HIGH TECH CORP0 citations49