Inventor · disambiguated record
Kai-Ye Huang
Also filed as: HUANG KAI · HUANG KAI-YE
2 granted patents·15 citations·filing 2003–2019
50Inventor score
Top patents by PatentIndex Score
2 records- 0164US6870387B2Method and test structures for measuring interconnect coupling capacitance in an IC chipWINBOND ELECTRONICS CORP·Filed 2003·Granted Mar 22, 2005·15 cites·13 claims
- 0256US11162915B2Built-in electrode electrical capacitance tomography sensorDALIAN INST CHEM & PHYSICS CAS·Filed 2019·Granted Nov 2, 2021·0 cites·18 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →