Inventor

OKAZAKI SHINJI

JP51 patents

⚠️ This page may combine multiple inventors who share the name “OKAZAKI SHINJI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

OKAZAKI SHINJI

HITACHI LTD

Method for forming a pattern and forming a thin film used in pattern formation

Photomask, manufacture of photomask, formation of pattern, manufacture of semiconductor device, and mask pattern design system

Electron beam lithography system and method

Electron beam lithography system and method

Electron beam lithography system and method

Stamper for replicating high-density data recording disks

Exposure method, aligner, and method of manufacturing semiconductor integrated circuit devices

Electron beam writing system used in a cell projection method

Pattern printing method and apparatus

Exposure method and pattern data preparation system therefor, pattern data preparation method and mask as well as exposure apparatus

Photomask, manufacture of photomask, formation of pattern, manufacture of semiconductor device, and mask pattern design system

Pattern forming method and projection exposure tool therefor

Exposure method and pattern data preparation system therefor, pattern data preparation method and mask as well as exposure apparatus

High density storage of information on a substrate with multiple depth and height

Projection type X-ray lithography apparatus

Radiation sensitive materials

Method of forming extrinsic base by diffusion from polysilicon/silicide source and emitter by lithography

Method of producing a semiconductor device

Electron beam lithography using an aperture having an array of repeated unit patterns

Method of forming patterns

Exposure method, aligner, and method of manufacturing semiconductor integrated circuit devices

Exposure method, aligner, and method manufacturing semiconductor integrated circuit devices

Charged beam exposure method and apparatus as well as aperture stop and production method thereof

Electronic beam drawing apparatus

Method of forming a pattern

Exposure method, aligner, and method manufacturing semiconductor integrated circuit devices

Electron beam pattern line width measurement system

Superfine electronic device and method for making same

SONY CORP

Method of controlling a communication terminal having a plurality of functions, communication terminal apparatus, communication control system

Method of controlling a communication terminal having a plurality of functions, communication terminal apparatus, communication control system

Method of generating ring tones using melody and communication terminal apparatus

Method of controlling a communication terminal having a plurality of functions, communication terminal apparatus, communication control system

Method of controlling a communication terminal having a plurality of functions, communication terminal apparatus, communication control system

Method of controlling a communication terminal having a plurality of functions, communication terminal apparatus, communication control system

Information processing method and apparatus and recording medium for controlling and simplifying a sign-up operation of an apparatus over a network

TAIHO PHARMACEUTICAL CO LTD

Condensed-indan derivatives and pharmaceutically acceptable salts thereof

Condensed-Indan derivatives and pharmaceutically acceptable salts thereof

Condensed-indan derivatives and pharmaceutically acceptable salts thereof

Condensed indan derivatives and salts thereof

HITACHI HIGH TECH CORP

Electron beam measurement apparatus

Defect inspection method and its system

GIGAPHOTON INC

Extreme UV light generation device

EUV light generator

ISHIKAWAJIMA HARIMA HEAVY IND

Apparatus and methods for manufacturing hot rolled steel sheets

KAKIZAKI KOUJI

Laser apparatus

SHIKOKU CHEM

4,4&#39;-Methylene-bis-(2-ethyl-5-methyl imidazole) and methods of producing and using the same

OKAI NOBUHIRO

Method and apparatus for inspecting reticle

SUMITOMO WIRING SYSTEMS

Method of and apparatus for calculating diameter of bundle of electric leads

SOHDA YASUNARI

Electron beam measurement apparatus

NAT UNIV CORP YOKOHAMA NAT UNIV

Nanostructure array, hydrogen detection element, and hydrogen detection device

4,4'-Methylene-bis-(2-ethyl-5-methyl imidazole) and methods of producing and using the same