Inventor
CHO BYUNG JIN
KR27 patents
⚠️ This page may combine multiple inventors who share the name “CHO BYUNG JIN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
KOREA ADVANCED INST SCI & TECH
6 patentsUS9129811B2Sep 8, 2015
Method and board for growing high-quality graphene layer using high pressure annealing
KOREA ADVANCED INST SCI & TECH12 citations80
US9472675B2Oct 18, 2016
Method of manufacturing n-doped graphene and electrical component using NH4F, and graphene and electrical component thereby
KOREA ADVANCED INST SCI & TECH3 citations66
US11984513B2May 14, 2024
Charge trapping non-volatile organic memory device
KOREA ADVANCED INST SCI & TECH0 citations53
US9428829B2Aug 30, 2016
Method for growing high-quality graphene layer
KOREA ADVANCED INST SCI & TECH1 citations48
US12418280B2Sep 16, 2025
Static change sense flip-flop
KOREA ADVANCED INST SCI & TECH0 citations44
US10535514B2Jan 14, 2020
Method of sealing open pores on surface of porous dielectric material using iCVD process
KOREA ADVANCED INST SCI & TECH0 citations38
HYUNDAI ELECTRONICS IND
6 patentsUS5985738ANov 16, 1999
Method for forming field oxide of semiconductor device using wet and dry oxidation
HYUNDAI ELECTRONICS IND9 citations73
US5940719AAug 17, 1999
Method for forming element isolating film of semiconductor device
HYUNDAI ELECTRONICS IND10 citations72
US6153481ANov 28, 2000
Method for forming an isolation insulating film for internal elements of a semiconductor device
HYUNDAI ELECTRONICS IND5 citations63
US5719086AFeb 17, 1998
Method for isolating elements of semiconductor device
HYUNDAI ELECTRONICS IND5 citations62
US6013561AJan 11, 2000
Method for forming field oxide film of semiconductor device
HYUNDAI ELECTRONICS IND1 citations52
US5846887ADec 8, 1998
Method for removing defects by ion implantation using medium temperature oxide layer
HYUNDAI ELECTRONICS IND1 citations52
CHARTERED SEMICONDUCTOR MFG
2 patentsUS6897118B1May 24, 2005
Method of multiple pulse laser annealing to activate ultra-shallow junctions
CHARTERED SEMICONDUCTOR MFG105 citations96
US7112499B2Sep 26, 2006
Dual step source/drain extension junction anneal to reduce the junction depth: multiple-pulse low energy laser anneal coupled with rapid thermal anneal
CHARTERED SEMICONDUCTOR MFG10 citations69
CHO BYUNG JIN
2 patentsKOREA INST ENERGY RES
2 patentsUS10247685B2Apr 2, 2019
High-temperature structure for measuring properties of curved thermoelectric device, and system and method for measuring properties of curved thermoelectric device using the same
KOREA INST ENERGY RES0 citations50
US10147864B2Dec 4, 2018
Fe—Ni/Ti metalized skutterudite thermoelectric material and method of manufacturing the same
KOREA INST ENERGY RES0 citations46