P

Inventor

MARR KENNETH W

US61 patents

Patents

50 patents
US5742555AApr 21, 1998

Method of anti-fuse repair

MICRON TECHNOLOGY INC105 citations99
US6630724B1Oct 7, 2003

Gate dielectric antifuse circuits and methods for operating same

MICRON TECHNOLOGY INC101 citations98
US6529421B1Mar 4, 2003

SRAM array with temperature-compensated threshold voltage

MICRON TECHNOLOGY INC105 citations98
US6979601B2Dec 27, 2005

Methods for fabricating fuses for use in semiconductor devices and semiconductor devices including such fuses

MICRON TECHNOLOGY INC55 citations96
US6879018B2Apr 12, 2005

Fuse for use in a semiconductor device, and semiconductor devices including the fuse

MICRON TECHNOLOGY INC32 citations96
US6809968B2Oct 26, 2004

SRAM array with temperature-compensated threshold voltage

MICRON TECHNOLOGY INC48 citations96
US6515931B2Feb 4, 2003

Method of anti-fuse repair

MICRON TECHNOLOGY INC34 citations96
US6430016B1Aug 6, 2002

Setpoint silicon controlled rectifier (SCR) electrostatic discharge (ESD) core clamp

MICRON TECHNOLOGY INC42 citations96
US6323534B1Nov 27, 2001

Fuse for use in a semiconductor device

MICRON TECHNOLOGY INC50 citations96
US6041008AMar 21, 2000

Method and apparatus for embedded read only memory in static random access memory

MICRON TECHNOLOGY INC68 citations96
US7126871B2Oct 24, 2006

Circuits and methods to protect a gate dielectric antifuse

MICRON TECHNOLOGY INC25 citations93
US7101738B2Sep 5, 2006

Gate dielectric antifuse circuit to protect a high-voltage transistor

MICRON TECHNOLOGY INC26 citations93
US7030458B2Apr 18, 2006

Gate dielectric antifuse circuits and methods for operating same

MICRON TECHNOLOGY INC29 citations93
US6936909B2Aug 30, 2005

Gate dielectric antifuse circuit to protect a high-voltage transistor

MICRON TECHNOLOGY INC31 citations93
US6894526B2May 17, 2005

Apparatus for determining burn-in reliability from wafer level burn-in

MICRON TECHNOLOGY INC16 citations93
US6836000B1Dec 28, 2004

Antifuse structure and method of use

MICRON TECHNOLOGY INC20 citations93
US6768617B2Jul 27, 2004

Setpoint silicon controlled rectifier (SCR) electrostatic discharge (ESD) core clamp

MICRON TECHNOLOGY INC21 citations93
US6751150B2Jun 15, 2004

Circuits and method to protect a gate dielectric antifuse

MICRON TECHNOLOGY INC16 citations93
US6410367B2Jun 25, 2002

Fuse for use in a semiconductor device, and semiconductor devices including the fuse

MICRON TECHNOLOGY INC18 citations93
US6233194B1May 15, 2001

Method of anti-fuse repair

MICRON TECHNOLOGY INC23 citations93
US6081464AJun 27, 2000

Circuit for SRAM test mode isolated bitline modulation

MICRON TECHNOLOGY INC32 citations93
US5978248ANov 2, 1999

Method of anti-fuse repair

MICRON TECHNOLOGY INC32 citations93
US5745415AApr 28, 1998

Circuit for SRAM test mode isolated bitline modulation

MICRON TECHNOLOGY INC18 citations93
US5568435AOct 22, 1996

Circuit for SRAM test mode isolated bitline modulation

MICRON TECHNOLOGY INC28 citations93
US9557376B2Jan 31, 2017

Apparatuses and methods for die seal crack detection

MICRON TECHNOLOGY INC10 citations84
US9287184B2Mar 15, 2016

Apparatuses and methods for die seal crack detection

MICRON TECHNOLOGY INC14 citations84
US7437632B2Oct 14, 2008

Circuits and methods for repairing defects in memory devices

MICRON TECHNOLOGY INC10 citations84
US7075763B2Jul 11, 2006

Methods, circuits, and applications using a resistor and a Schottky diode

MICRON TECHNOLOGY INC13 citations84
US6584030B2Jun 24, 2003

Memory circuit regulation system and method

MICRON TECHNOLOGY INC16 citations84
US6551864B2Apr 22, 2003

Fuse for use in a semiconductor device, and semiconductor devices including the fuse

MICRON TECHNOLOGY INC12 citations82
US9281078B2Mar 8, 2016

Program operations with embedded leak checks

MICRON TECHNOLOGY INC7 citations80
US7425472B2Sep 16, 2008

Semiconductor fuses and semiconductor devices containing the same

MICRON TECHNOLOGY INC7 citations74
US7279918B2Oct 9, 2007

Methods for wafer level burn-in

MICRON TECHNOLOGY INC3 citations74
US7215134B2May 8, 2007

Apparatus for determining burn-in reliability from wafer level burn-in

MICRON TECHNOLOGY INC3 citations74
US7183792B2Feb 27, 2007

Method and system for detecting a mode of operation of an integrated circuit, and a memory device including same

MICRON TECHNOLOGY INC7 citations74
US7119568B2Oct 10, 2006

Methods for wafer level burn-in

MICRON TECHNOLOGY INC5 citations74
US7038481B2May 2, 2006

Method and apparatus for determining burn-in reliability from wafer level burn-in

MICRON TECHNOLOGY INC6 citations74
US6943575B2Sep 13, 2005

Method, circuit and system for determining burn-in reliability from wafer level burn-in

MICRON TECHNOLOGY INC9 citations74
US6495902B2Dec 17, 2002

Fuse for use in a semiconductor device, and semiconductor devices including the fuse

MICRON TECHNOLOGY INC8 citations74
US10580766B2Mar 3, 2020

Methods of forming circuit-protection devices

MICRON TECHNOLOGY INC2 citations73
US10431577B2Oct 1, 2019

Methods of forming circuit-protection devices

MICRON TECHNOLOGY INC3 citations73
US9761322B2Sep 12, 2017

Program operations with embedded leak checks

MICRON TECHNOLOGY INC2 citations68
US12237278B2Feb 25, 2025

Active protection circuits for semiconductor devices

MICRON TECHNOLOGY INC0 citations63
US12015026B2Jun 18, 2024

Methods of forming circuit-protection devices

MICRON TECHNOLOGY INC0 citations63
US11823731B2Nov 21, 2023

Semiconductor device protection circuits, and associated methods, devices, and systems

MICRON TECHNOLOGY INC0 citations63
US11676917B2Jun 13, 2023

Active protection circuits for semiconductor devices

MICRON TECHNOLOGY INC0 citations63
US11158367B1Oct 26, 2021

Semiconductor device protection circuits for protecting a semiconductor device during processing thereof, and associated methods, devices, and systems

MICRON TECHNOLOGY INC0 citations63
US11139289B2Oct 5, 2021

Circuit-protection devices

MICRON TECHNOLOGY INC0 citations63
US7836362B2Nov 16, 2010

Circuits and methods for repairing defects in memory devices

MICRON TECHNOLOGY INC2 citations63
US7405463B2Jul 29, 2008

Gate dielectric antifuse circuit to protect a high-voltage transistor

MICRON TECHNOLOGY INC1 citations63

Showing the top 50 of 61 patents by PatentIndex Score.