Inventor

HINTZE BERND

DE9 patents

⚠️ This page may combine multiple inventors who share the name “HINTZE BERND”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

GLOBALFOUNDRIES INC

4 patents

US9177858B1Nov 3, 2015

Methods for fabricating integrated circuits including barrier layers for interconnect structures

GLOBALFOUNDRIES INC32 citations92

US9147618B2Sep 29, 2015

Method for detecting defects in a diffusion barrier layer

GLOBALFOUNDRIES INC2 citations59

US10090195B2Oct 2, 2018

Method including a formation of a diffusion barrier and semiconductor structure including a diffusion barrier

GLOBALFOUNDRIES INC0 citations50

US9171754B2Oct 27, 2015

Method including an etching of a portion of an interlayer dielectric in a semiconductor structure, a degas process and a preclean process

GLOBALFOUNDRIES INC0 citations33

QIMONDA AG

2 patents

US7880212B2Feb 1, 2011

Method for producing a dielectric interlayer and storage capacitor with such a dielectric interlayer

QIMONDA AG0 citations49

US7531418B2May 12, 2009

Method of producing a conductive layer including two metal nitrides

QIMONDA AG0 citations48

INFINEON TECHNOLOGIES AG

1 patent

US7416952B2Aug 26, 2008

Method for producing a dielectric interlayer and storage capacitor with such a dielectric interlayer

INFINEON TECHNOLOGIES AG1 citations49

MOLL HANS-PETER

1 patent

US8138538B2Mar 20, 2012

Interconnect structure for semiconductor devices

MOLL HANS-PETER1 citations44

HINTZE BERND

1 patent

US9177826B2Nov 3, 2015

Methods of forming metal nitride materials

HINTZE BERND1 citations43