Inventor
EISNER EDWARD C
US19 patents
⚠️ This page may combine multiple inventors who share the name “EISNER EDWARD C”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
AXCELIS TECH INC
15 patentsUS7399980B2Jul 15, 2008
Systems and methods for beam angle adjustment in ion implanters
AXCELIS TECH INC20 citations92
US7227160B1Jun 5, 2007
Systems and methods for beam angle adjustment in ion implanters
AXCELIS TECH INC21 citations92
US7615763B2Nov 10, 2009
System for magnetic scanning and correction of an ion beam
AXCELIS TECH INC16 citations84
US7550751B2Jun 23, 2009
Ion beam scanning control methods and systems for ion implantation uniformity
AXCELIS TECH INC8 citations84
US7589333B2Sep 15, 2009
Methods for rapidly switching off an ion beam
AXCELIS TECH INC12 citations83
US10037877B1Jul 31, 2018
Ion implantation system having beam angle control in drift and deceleration modes
AXCELIS TECH INC6 citations73
US9679739B2Jun 13, 2017
Combined electrostatic lens system for ion implantation
AXCELIS TECH INC4 citations73
US10483086B2Nov 19, 2019
Beam profiling speed enhancement for scanned beam implanters
AXCELIS TECH INC2 citations68
US8008636B2Aug 30, 2011
Ion implantation with diminished scanning field effects
AXCELIS TECH INC3 citations62
US7566886B2Jul 28, 2009
Throughput enhancement for scanned beam ion implanters
AXCELIS TECH INC5 citations62
US7453074B2Nov 18, 2008
Ion implanter with ionization chamber electrode design
AXCELIS TECH INC4 citations60
US8653486B2Feb 18, 2014
Method and apparatus for improved uniformity control with dynamic beam shaping
AXCELIS TECH INC1 citations51
US7858955B2Dec 28, 2010
System and method of controlling broad beam uniformity
AXCELIS TECH INC0 citations51
US8378313B2Feb 19, 2013
Uniformity of a scanned ion beam
AXCELIS TECH INC0 citations50
US9620327B2Apr 11, 2017
Combined multipole magnet and dipole scanning magnet
AXCELIS TECH INC0 citations41
EISNER EDWARD C
3 patentsUS8637838B2Jan 28, 2014
System and method for ion implantation with improved productivity and uniformity
EISNER EDWARD C10 citations82
US8963107B2Feb 24, 2015
Beam line design to reduce energy contamination
EISNER EDWARD C3 citations61
US8421039B2Apr 16, 2013
Method and apparatus for improved uniformity control with dynamic beam shaping
EISNER EDWARD C2 citations60