Inventor
GOSS JOHN R
US26 patents
⚠️ This page may combine multiple inventors who share the name “GOSS JOHN R”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
IBM
19 patentsUS7911820B2Mar 22, 2011
Regulating electrical fuse programming current
IBM17 citations84
US7656182B2Feb 2, 2010
Testing method using a scalable parametric measurement macro
IBM9 citations84
US9881694B2Jan 30, 2018
Built-in-self-test (BIST) engine configured to store a per pattern based fail status in a pattern mask register
IBM6 citations82
US9274171B1Mar 1, 2016
Customer-transparent logic redundancy for improved yield
IBM5 citations82
US7560946B2Jul 14, 2009
Method of acceptance for semiconductor devices
IBM10 citations82
US10971243B2Apr 6, 2021
Built-in self-test (BIST) engine configured to store a per pattern based fail status in a pattern mask register
IBM1 citations71
US10692584B2Jun 23, 2020
Built-in self-test (BIST) engine configured to store a per pattern based fail status in a pattern mask register
IBM1 citations71
US9791507B2Oct 17, 2017
Customer-transparent logic redundancy for improved yield
IBM2 citations71
US7145977B2Dec 5, 2006
Diagnostic method and apparatus for non-destructively observing latch data
IBM2 citations62
US11293980B2Apr 5, 2022
Customer-transparent logic redundancy for improved yield
IBM0 citations61
US11295829B2Apr 5, 2022
Built-in self-test (BIST) engine configured to store a per pattern based fail status in a pattern mask register
IBM0 citations61
US10955474B2Mar 23, 2021
Customer-transparent logic redundancy for improved yield
IBM0 citations61
US10551436B2Feb 4, 2020
Customer-transparent logic redundancy for improved yield
IBM0 citations51
US10553302B2Feb 4, 2020
Built-in self-test (BIST) engine configured to store a per pattern based fail status in a pattern mask register
IBM0 citations51
US8963566B2Feb 24, 2015
Thermally adaptive in-system allocation
IBM1 citations51
US7453973B2Nov 18, 2008
Diagnostic method and apparatus for non-destructively observing latch data
IBM0 citations49
US7916826B2Mar 29, 2011
Diagnostic method and apparatus for non-destructively observing latch data
IBM0 citations48
US7904839B2Mar 8, 2011
System and method for controlling access to addressable integrated circuits
IBM0 citations40
US7831936B2Nov 9, 2010
Structure for a system for controlling access to addressable integrated circuits
IBM0 citations40