P

Inventor

CHOI HYUN MIN

KR45 patents
⚠️ This page may combine multiple inventors who share the name “CHOI HYUN MIN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

SAMSUNG ELECTRONICS CO LTD

26 patents
US9646711B2May 9, 2017

Memory device

SAMSUNG ELECTRONICS CO LTD2 citations73
US9627314B2Apr 18, 2017

Fuse structure and method of blowing the same

SAMSUNG ELECTRONICS CO LTD2 citations73
US9368445B2Jun 14, 2016

E-fuse structure of semiconductor device

SAMSUNG ELECTRONICS CO LTD3 citations73
US9627390B2Apr 18, 2017

Semiconductor device having fin-type active patterns and gate nodes

SAMSUNG ELECTRONICS CO LTD3 citations72
US10685968B2Jun 16, 2020

Anti-fuse one-time programmable (OTP) device

SAMSUNG ELECTRONICS CO LTD2 citations71
US10192823B2Jan 29, 2019

Semiconductor device and method of manufacturing the same

SAMSUNG ELECTRONICS CO LTD5 citations71
US9293701B2Mar 22, 2016

Variable resistance memory device and a method of fabricating the same

SAMSUNG ELECTRONICS CO LTD4 citations71
US9502425B2Nov 22, 2016

Semiconductor device and method of manufacturing the same

SAMSUNG ELECTRONICS CO LTD4 citations70
US7863152B2Jan 4, 2011

Semiconductor device structure with strain layer and method of fabricating the semiconductor device structure

SAMSUNG ELECTRONICS CO LTD6 citations70
US9087842B2Jul 21, 2015

Semiconductor device including fuse structure

SAMSUNG ELECTRONICS CO LTD6 citations69
US9331085B2May 3, 2016

Non-volatile memory with improved sensing window

SAMSUNG ELECTRONICS CO LTD5 citations68
US10186516B2Jan 22, 2019

One time programmable memory device, method of manufacturing the same, and electronic device including the same

SAMSUNG ELECTRONICS CO LTD5 citations67
US9419004B2Aug 16, 2016

Fuse structure and semiconductor device including the same

SAMSUNG ELECTRONICS CO LTD2 citations63
US9059090B2Jun 16, 2015

Semiconductor device and method for fabricating the same

SAMSUNG ELECTRONICS CO LTD3 citations62
US8350354B2Jan 8, 2013

Semiconductor device structure with strain layer

SAMSUNG ELECTRONICS CO LTD4 citations59
US10249566B2Apr 2, 2019

Semiconductor device including fuse structure

SAMSUNG ELECTRONICS CO LTD0 citations52
US9953919B2Apr 24, 2018

Semiconductor device including fuse structure

SAMSUNG ELECTRONICS CO LTD0 citations52
US9935049B2Apr 3, 2018

E-fuse structure of semiconductor device

SAMSUNG ELECTRONICS CO LTD0 citations52
US9230925B2Jan 5, 2016

Fuse structure and method of blowing the same

SAMSUNG ELECTRONICS CO LTD1 citations52
US9397234B2Jul 19, 2016

Pumping capacitor

SAMSUNG ELECTRONICS CO LTD0 citations51
US9967658B2May 8, 2018

Method for processing sound by electronic device and electronic device thereof

SAMSUNG ELECTRONICS CO LTD0 citations50
US10148811B2Dec 4, 2018

Electronic device and method for controlling voice signal

SAMSUNG ELECTRONICS CO LTD1 citations49
US9887202B2Feb 6, 2018

Semiconductor device and method of manufacturing the same

SAMSUNG ELECTRONICS CO LTD0 citations49
US9390812B2Jul 12, 2016

E-fuse test device and semiconductor device including the same

SAMSUNG ELECTRONICS CO LTD1 citations49
US7888772B2Feb 15, 2011

Electronic fuse having heat spreading structure

SAMSUNG ELECTRONICS CO LTD1 citations45
US9336894B2May 10, 2016

Memory device including nonvolatile memory cell

SAMSUNG ELECTRONICS CO LTD0 citations40

CHOI HYUN-MIN

3 patents

CHOI HYUN MIN

3 patents

PARK YOUNG WOO

3 patents

KIM JU-YOUN

1 patent

SS CLINIC CORP

1 patent

LG ELECTRONICS INC

1 patent

PENTA SECURITY SYSTEMS INC

1 patent

AHN JEONG-HOON

1 patent

SEOUL NAT UNIV IND FOUNDATION

1 patent

SUL KYUNG IL

1 patent

YU ARUM

1 patent

NAT UNIV CHANGWON IND ACADEMY COOP CORPS

1 patent

PARK KYOUNG SOO

1 patent