Inventor

KUGE HIROYOSHI

JP2 patents

⚠️ This page may combine multiple inventors who share the name “KUGE HIROYOSHI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

NEC ELECTRONICS CORP

1 patent

US7263679B2Aug 28, 2007

Semiconductor integrated circuit device with boundary scan test and design automation apparatus, boundary scan test method and program

NEC ELECTRONICS CORP21 citations87

NEC CORP

1 patent

US6212492B1Apr 3, 2001

Apparatus and method for circuit simulation which accounts for parasitic elements

NEC CORP25 citations85