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Inventor
LIANG SHIH-LIANG
TW
2 patents
Patents
2 patents
US7235412B1
Jun 26, 2007
Semiconductor component having test pads and method and apparatus for testing same
XILINX INC
19 citations
90
US7737439B2
Jun 15, 2010
Semiconductor component having test pads and method and apparatus for testing same
XILINX INC
5 citations
71