Inventor
BEFFA RAY
US24 patents
Patents
24 patentsUS5867505AFeb 2, 1999
Method and apparatus for testing an integrated circuit including the step/means for storing an associated test identifier in association with integrated circuit identifier for each test to be performed on the integrated circuit
MICRON TECHNOLOGY INC98 citations99
US6233185B1May 15, 2001
Wafer level burn-in of memory integrated circuits
MICRON TECHNOLOGY INC88 citations98
US5657284AAug 12, 1997
Apparatus and method for testing for defects between memory cells in packaged semiconductor memory devices
MICRON TECHNOLOGY INC72 citations96
US5982682ANov 9, 1999
Self-test circuit for memory integrated circuits
MICRON TECHNOLOGY INC87 citations95
US5754486AMay 19, 1998
Self-test circuit for memory integrated circuits
MICRON TECHNOLOGY INC55 citations95
US6058056AMay 2, 2000
Data compression circuit and method for testing memory devices
MICRON TECHNOLOGY INC78 citations94
US6079037AJun 20, 2000
Method and apparatus for detecting intercell defects in a memory device
MICRON TECHNOLOGY INC25 citations93
US5898629AApr 27, 1999
System for stressing a memory integrated circuit die
MICRON TECHNOLOGY INC31 citations93
US5852581ADec 22, 1998
Method of stress testing memory integrated circuits
MICRON TECHNOLOGY INC42 citations93
US7069484B2Jun 27, 2006
System for optimizing anti-fuse repair time using fuse id
MICRON TECHNOLOGY INC13 citations92
US6625073B1Sep 23, 2003
Apparatus and method for testing for defects between memory cells in packaged semiconductor memory devices
MICRON TECHNOLOGY INC42 citations92
US6347386B1Feb 12, 2002
System for optimizing the testing and repair time of a defective integrated circuit
MICRON TECHNOLOGY INC20 citations92
US6181154B1Jan 30, 2001
Method and apparatus for testing of dielectric defects in a packaged semiconductor memory device
MICRON TECHNOLOGY INC29 citations92
US6128756AOct 3, 2000
System for optimizing the testing and repair time of a defective integrated circuit
MICRON TECHNOLOGY INC27 citations92
US6094734AJul 25, 2000
Test arrangement for memory devices using a dynamic row for creating test data
MICRON TECHNOLOGY INC27 citations92
US6003149ADec 14, 1999
Test method and apparatus for writing a memory array with a reduced number of cycles
MICRON TECHNOLOGY INC26 citations92
US5966025AOct 12, 1999
Method and apparatus for testing of dielectric defects in a packaged semiconductor memory device
MICRON TECHNOLOGY INC19 citations92
US5885846AMar 23, 1999
Method and apparatus for testing of dielectric defects in a packaged semiconductor memory device
MICRON TECHNOLOGY INC21 citations92
USRE38956EJan 31, 2006
Data compression circuit and method for testing memory devices
MICRON TECHNOLOGY INC11 citations82
US6622270B2Sep 16, 2003
System for optimizing anti-fuse repair time using fuse ID
MICRON TECHNOLOGY INC12 citations82
US5965902AOct 12, 1999
Method and apparatus for testing of dielectric defects in a packaged semiconductor memory device
MICRON TECHNOLOGY INC15 citations82
US6442719B1Aug 27, 2002
Method and apparatus for detecting intercell defects in a memory device
MICRON TECHNOLOGY INC11 citations74
US7120073B2Oct 10, 2006
Integrated circuit devices having reducing variable retention characteristics
MICRON TECHNOLOGY INC7 citations73
US6898138B2May 24, 2005
Method of reducing variable retention characteristics in DRAM cells
MICRON TECHNOLOGY INC7 citations73