Inventor
LIAO CHIH-CHERNG
TW52 patents
Patents
50 patentsUS5858882AJan 12, 1999
In-situ low wafer temperature oxidized gas plasma surface treatment process
VANGUARD INT SEMICONDUCT CORP21 citations92
US5637190AJun 10, 1997
Plasma purge method for plasma process particle control
VANGUARD INT SEMICONDUCT CORP25 citations92
US5583070ADec 10, 1996
Process to form rugged polycrystalline silicon surfaces
VANGUARD INT SEMICONDUCT CORP35 citations92
US8803234B1Aug 12, 2014
High voltage semiconductor device and method for fabricating the same
VANGUARD INT SEMICONDUCT CORP24 citations88
US9525045B1Dec 20, 2016
Semiconductor devices and methods for forming the same
VANGUARD INT SEMICONDUCT CORP10 citations83
US6972471B2Dec 6, 2005
Deep trench isolation structure of a high-voltage device and method for forming thereof
VANGUARD INT SEMICONDUCT CORP12 citations83
US9929283B1Mar 27, 2018
Junction field effect transistor (JFET) with first and second top layer of opposite conductivity type for high driving current and low pinch-off voltage
VANGUARD INT SEMICONDUCT CORP3 citations73
US9263574B1Feb 16, 2016
Semiconductor device and method for fabricating the same
VANGUARD INT SEMICONDUCT CORP3 citations73
US7242070B2Jul 10, 2007
Deep trench isolation structure of a high-voltage device and method for forming thereof
VANGUARD INT SEMICONDUCT CORP9 citations73
US7041572B2May 9, 2006
Fabrication method for a deep trench isolation structure of a high-voltage device
VANGUARD INT SEMICONDUCT CORP9 citations73
US11127847B2Sep 21, 2021
Semiconductor devices having a gate field plate including an extension portion and methods for fabricating the semiconductor device
VANGUARD INT SEMICONDUCT CORP2 citations72
US9548354B1Jan 17, 2017
Semiconductor devices and methods for fabricating the same
VANGUARD INT SEMICONDUCT CORP5 citations72
US11637139B2Apr 25, 2023
Semiconductor device including light-collimating layer and biometric device using the same
VANGUARD INT SEMICONDUCT CORP2 citations70
US10388758B2Aug 20, 2019
Semiconductor structure having a high voltage well region
VANGUARD INT SEMICONDUCT CORP2 citations70
US11088541B2Aug 10, 2021
Integrated circuit and electrostatic discharge protection circuit thereof
VANGUARD INT SEMICONDUCT CORP2 citations69
US11374096B1Jun 28, 2022
High voltage semiconductor device
VANGUARD INT SEMICONDUCT CORP2 citations65
US6713338B2Mar 30, 2004
Method for fabricating source/drain devices
VANGUARD INT SEMICONDUCT CORP7 citations65
US6680231B1Jan 20, 2004
High-voltage device process compatible with low-voltage device process
VANGUARD INT SEMICONDUCT CORP6 citations62
US11335717B2May 17, 2022
Semiconductor device including light-collimating layer
VANGUARD INT SEMICONDUCT CORP0 citations60
US11538840B2Dec 27, 2022
Color filters disposed in holes of a light collimator, manufacturing method of the same and biometric identification apparatus using the same
VANGUARD INT SEMICONDUCT CORP0 citations59
US7476934B2Jan 13, 2009
Structure for an LDMOS transistor and fabrication method thereof
VANGUARD INT SEMICONDUCT CORP4 citations59
US7074658B2Jul 11, 2006
Structure for an LDMOS transistor and fabrication method for thereof
VANGUARD INT SEMICONDUCT CORP2 citations59
US11569121B2Jan 31, 2023
Methods for forming semiconductor devices
VANGUARD INT SEMICONDUCT CORP0 citations58
US6191019B1Feb 20, 2001
Method for forming a polysilicon layer in a polycide process flow
VANGUARD INT SEMICONDUCT CORP4 citations57
US6057218AMay 2, 2000
Method for simultaneously manufacturing poly gate and polycide gate
VANGUARD INT SEMICONDUCT CORP3 citations55
US9614078B1Apr 4, 2017
Metal-oxide field effect transistor having an oxide region within a lightly doped drain region
VANGUARD INT SEMICONDUCT CORP0 citations52
US9530900B1Dec 27, 2016
Schottky diode and method for manufacturing the same
VANGUARD INT SEMICONDUCT CORP0 citations52
US12588272B2Mar 24, 2026
Semiconductor device
VANGUARD INT SEMICONDUCT CORP0 citations51
US10056260B2Aug 21, 2018
Schottky diode with dielectrically isolated diffusions, and method of manufacturing the same
VANGUARD INT SEMICONDUCT CORP1 citations51
US12513981B2Dec 30, 2025
Semiconductor device
VANGUARD INT SEMICONDUCT CORP0 citations50
US10395085B2Aug 27, 2019
Semiconductor device and fingerprint sensor device thereof
VANGUARD INT SEMICONDUCT CORP0 citations50
US12279455B2Apr 15, 2025
Semiconductor device and method of fabricating the same
VANGUARD INT SEMICONDUCT CORP0 citations49
US11217708B2Jan 4, 2022
Optical sensor and method for forming the same
VANGUARD INT SEMICONDUCT CORP0 citations49
US10572070B2Feb 25, 2020
Optical devices and fabrication method thereof
VANGUARD INT SEMICONDUCT CORP0 citations49
US11393921B2Jul 19, 2022
High-voltage semiconductor device
VANGUARD INT SEMICONDUCT CORP0 citations48
US11436992B2Sep 6, 2022
Display system and method for forming an output buffer of a source driver
VANGUARD INT SEMICONDUCT CORP0 citations47
US12495562B2Dec 9, 2025
Semiconductor device and fabrication method thereof
VANGUARD INT SEMICONDUCT CORP0 citations46
US11742389B2Aug 29, 2023
Semiconductor structure and method for forming the same
VANGUARD INT SEMICONDUCT CORP0 citations45
US12532537B2Jan 20, 2026
Semiconductor device with a deep trench isolation structure and buried layers for reducing substrate leakage current and avoiding latch-up effect, and fabrication method thereof
VANGUARD INT SEMICONDUCT CORP0 citations44
US6835636B2Dec 28, 2004
Method for fabricating source/drain devices
VANGUARD INT SEMICONDUCT CORP0 citations43
US11387361B2Jul 12, 2022
Semiconductor structure and method for forming the same
VANGUARD INT SEMICONDUCT CORP0 citations42
US10256310B1Apr 9, 2019
Split-gate flash memory cell having a floating gate situated in a concave trench in a semiconductor substrate
VANGUARD INT SEMICONDUCT CORP0 citations42
US9985019B2May 29, 2018
Semiconductor structure with high-voltage and low-voltage CMOS devices and method for manufacturing the same
VANGUARD INT SEMICONDUCT CORP0 citations42
US9553091B1Jan 24, 2017
Semiconductor structure and method for manufacturing the same
VANGUARD INT SEMICONDUCT CORP0 citations42
US10868198B2Dec 15, 2020
Semiconductor device including zener diode and method of manufacturing thereof
VANGUARD INT SEMICONDUCT CORP0 citations41
US10700190B2Jun 30, 2020
Semiconductor devices and methods for manufacturing the same
VANGUARD INT SEMICONDUCT CORP0 citations41
US9748339B1Aug 29, 2017
Semiconductor device and method for fabricating the same
VANGUARD INT SEMICONDUCT CORP0 citations41
US9318601B2Apr 19, 2016
Semiconductor device and method for fabricating the same
VANGUARD INT SEMICONDUCT CORP0 citations40
US10680120B2Jun 9, 2020
Semiconductor device and method for manufacturing the same
VANGUARD INT SEMICONDUCT CORP0 citations39
US10147636B2Dec 4, 2018
Methods for fabricating trench isolation structure
VANGUARD INT SEMICONDUCT CORP0 citations35
Showing the top 50 of 52 patents by PatentIndex Score.