Inventor
GAWLIK BRIAN
US2 patents
Patents
2 patentsUS10026609B2Jul 17, 2018
Nanoshape patterning techniques that allow high-speed and low-cost fabrication of nanoshape structures
UNIV TEXAS46 citations90
US10816482B2Oct 27, 2020
High throughput, high resolution optical metrology for reflective and transmissive nanophotonic devices
UNIV TEXAS6 citations69