Inventor
SONG LI
US53 patents
⚠️ This page may combine multiple inventors who share the name “SONG LI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
CHENGDU BOE OPTOELECT TECH CO
11 patentsUS11974466B2Apr 30, 2024
Display panel and display device
CHENGDU BOE OPTOELECT TECH CO2 citations73
US11444262B2Sep 13, 2022
Display panel and display device having a non-planar substrate surface
CHENGDU BOE OPTOELECT TECH CO2 citations73
US12328997B2Jun 10, 2025
Display panel and display apparatus having arrangement of dam regions
CHENGDU BOE OPTOELECT TECH CO0 citations52
US12183230B2Dec 31, 2024
Display substrate, detection method therefor, and display device
CHENGDU BOE OPTOELECT TECH CO0 citations52
US12150333B2Nov 19, 2024
Display panel and preparation method thereof, and display apparatus
CHENGDU BOE OPTOELECT TECH CO0 citations52
US12016221B2Jun 18, 2024
Display substrate having a display region and a non-display region surrounding the display region and method for manufacturing the same
CHENGDU BOE OPTOELECT TECH CO0 citations52
US11903273B2Feb 13, 2024
Display substrate and display device
CHENGDU BOE OPTOELECT TECH CO0 citations52
US11871626B2Jan 9, 2024
Display panel and display device
CHENGDU BOE OPTOELECT TECH CO0 citations52
US11569332B2Jan 31, 2023
Display substrate and display device
CHENGDU BOE OPTOELECT TECH CO0 citations52
US11362290B2Jun 14, 2022
Display substrate, method of manufacturing display substrate, and display apparatus
CHENGDU BOE OPTOELECT TECH CO0 citations52
US11217765B2Jan 4, 2022
Display substrate, fabricating method of display substrate, and display device
CHENGDU BOE OPTOELECT TECH CO0 citations52
KLA TENCOR TECH CORP
4 patentsUS6751519B1Jun 15, 2004
Methods and systems for predicting IC chip yield
KLA TENCOR TECH CORP222 citations99
US6813572B2Nov 2, 2004
Apparatus and methods for managing reliability of semiconductor devices
KLA TENCOR TECH CORP69 citations96
US6948141B1Sep 20, 2005
Apparatus and methods for determining critical area of semiconductor design data
KLA TENCOR TECH CORP112 citations95
US6918101B1Jul 12, 2005
Apparatus and methods for determining critical area of semiconductor design data
KLA TENCOR TECH CORP67 citations95
BEST PACIFIC TEXTILE LTD
4 patentsINSPECK INC
3 patentsUS6493095B1Dec 10, 2002
Optional 3D digitizer, system and method for digitizing an object
INSPECK INC83 citations93
US6664531B2Dec 16, 2003
Combined stereovision, color 3D digitizing and motion capture system
INSPECK INC66 citations90
US7274470B2Sep 25, 2007
Optical 3D digitizer with enlarged no-ambiguity zone
INSPECK INC20 citations87
SONG LI
3 patentsKODIAK SCIENCES INC
3 patentsFUTUREWEI TECHNOLOGIES INC
2 patentsSYMYX TECHNOLOGIES INC
2 patentsWANG SHUMING
2 patentsUNIV OKLAHOMA
2 patentsBEIJING BYTEDANCE NETWORK TECH CO LTD
2 patentsHKC CORP LTD
2 patentsGALLERIA IND COMPANY
1 patentLETA DANIEL P
1 patentBEIJING ZITIAO NETWORK TECHNOLOGY CO LTD
1 patentSONY GROUP CORP
1 patentINST MATERIA MEDICA CAMS
1 patentBIGO TECH PTE LTD
1 patentGLOBALFOUNDRIES SG PTE LTD
1 patentINST OF INFORMATION ENGINEERING CHINESE ACADEMY OF SCIENCES
1 patentUNIV YANGZHOU
1 patentJINGDONG CITY BEIJING DIGITS TECH CO LTD
1 patentShowing the top 50 of 53 patents by PatentIndex Score.