Inventor
HSU JEN-SHOU
TW23 patents
⚠️ This page may combine multiple inventors who share the name “HSU JEN-SHOU”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
ETRON TECHNOLOGY INC
12 patentsUS7741898B2Jun 22, 2010
Charge pump circuit for high voltage generation
ETRON TECHNOLOGY INC24 citations92
US7031219B2Apr 18, 2006
Internal power management scheme for a memory chip in deep power down mode
ETRON TECHNOLOGY INC25 citations92
US7551018B2Jun 23, 2009
Decoupling capacitor circuit
ETRON TECHNOLOGY INC8 citations84
US7292494B2Nov 6, 2007
Internal power management scheme for a memory chip in deep power down mode
ETRON TECHNOLOGY INC15 citations84
US7570104B2Aug 4, 2009
Charge pump circuit control system
ETRON TECHNOLOGY INC18 citations83
US7277315B2Oct 2, 2007
Multiple power supplies for the driving circuit of local word line driver of DRAM
ETRON TECHNOLOGY INC15 citations81
US7002870B2Feb 21, 2006
Speeding up the power-up procedure for low power RAM
ETRON TECHNOLOGY INC8 citations73
US7623388B2Nov 24, 2009
Method for detecting erroneous word lines of a memory array and device thereof
ETRON TECHNOLOGY INC7 citations67
US7479775B2Jan 20, 2009
Negative voltage generator
ETRON TECHNOLOGY INC2 citations62
US7434985B2Oct 14, 2008
Calibrated built-in temperature sensor and calibration method thereof
ETRON TECHNOLOGY INC4 citations62
US7817485B2Oct 19, 2010
Memory testing system and memory module thereof
ETRON TECHNOLOGY INC4 citations56
US7796448B2Sep 14, 2010
Trigger circuit of a column redundant circuit and related column redundant device
ETRON TECHNOLOGY INC0 citations51
ELITE SEMICONDUCTOR MEMORY TECH INC
4 patentsUS10916293B1Feb 9, 2021
Target row refresh mechanism capable of effectively determining target row address to effectively mitigate row hammer errors without using counter circuit
ELITE SEMICONDUCTOR MEMORY TECH INC10 citations82
US9484117B2Nov 1, 2016
Semiconductor memory device having compression test mode
ELITE SEMICONDUCTOR MEMORY TECH INC3 citations72
US11073862B2Jul 27, 2021
Synchronization circuit and cascaded synchronization circuit for converting asynchronous signal into synchronous signal
ELITE SEMICONDUCTOR MEMORY TECH INC0 citations51
US9575114B2Feb 21, 2017
Test system and device
ELITE SEMICONDUCTOR MEMORY TECH INC0 citations40
ELITE SEMICONDUCTOR MICROELECTRONICS TECHNOLOGY INC
4 patentsUS11100963B1Aug 24, 2021
Data first-in first-out (FIFO) circuit
ELITE SEMICONDUCTOR MICROELECTRONICS TECHNOLOGY INC5 citations72
US11955163B2Apr 9, 2024
Method and circuit for adaptive column-select line signal generation
ELITE SEMICONDUCTOR MICROELECTRONICS TECHNOLOGY INC0 citations61
US11545200B1Jan 3, 2023
Data control circuit for increasing maximum and minimum tolerance values of skew between DQS signal and clock signal during write operation and associated memory device
ELITE SEMICONDUCTOR MICROELECTRONICS TECHNOLOGY INC1 citations61
US11727968B2Aug 15, 2023
Method for self-calibrating tDQSCK that is skew between rising edge of memory clock signal and rising edge of DQS signal during read operation and associated signal processing circuit
ELITE SEMICONDUCTOR MICROELECTRONICS TECHNOLOGY INC0 citations51