Inventor
DIERICKX BART
BE37 patents
⚠️ This page may combine multiple inventors who share the name “DIERICKX BART”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
CAELESTE CVBA
9 patentsUS10284824B2May 7, 2019
Opto-electronic stacked sensor
CAELESTE CVBA9 citations81
US11463634B2Oct 4, 2022
Charge domain binning in a MOS pixel
CAELESTE CVBA2 citations73
US11330207B1May 10, 2022
High dynamic range in direct injection
CAELESTE CVBA3 citations73
US9819882B2Nov 14, 2017
Global shutter high dynamic range sensor
CAELESTE CVBA4 citations67
US10497737B2Dec 3, 2019
Enhanced dynamic range imaging
CAELESTE CVBA1 citations62
US12096138B2Sep 17, 2024
Quasi-global shutter for image sensors
CAELESTE CVBA0 citations52
US11997404B2May 28, 2024
Single-ended signal to differential signal conversion
CAELESTE CVBA0 citations52
US9699398B2Jul 4, 2017
Pixel with increased charge storage
CAELESTE CVBA1 citations48
US10616521B2Apr 7, 2020
Imaging device for detecting sparse event information in a pixel array
CAELESTE CVBA0 citations35
CYPRESS SEMICONDUCTOR CORP
5 patentsUS7750958B1Jul 6, 2010
Pixel structure
CYPRESS SEMICONDUCTOR CORP76 citations98
US7808022B1Oct 5, 2010
Cross talk reduction
CYPRESS SEMICONDUCTOR CORP9 citations84
US7313288B2Dec 25, 2007
Defect pixel correction in an image sensor
CYPRESS SEMICONDUCTOR CORP11 citations84
US7106915B2Sep 12, 2006
Methods and devices for reading out an image sensor with reduced delay time between lines
CYPRESS SEMICONDUCTOR CORP16 citations84
US7333040B1Feb 19, 2008
Flash ADC with sparse codes matched to input noise
CYPRESS SEMICONDUCTOR CORP8 citations72
CYPRESS SEMICONDUCTOR CORP BEL
5 patentsUS7224389B2May 29, 2007
Method to adjust the signal level of an active pixel and corresponding active pixel
CYPRESS SEMICONDUCTOR CORP BEL65 citations97
US7253019B2Aug 7, 2007
Buried, fully depletable, high fill factor photodiodes
CYPRESS SEMICONDUCTOR CORP BEL10 citations84
US7106373B1Sep 12, 2006
Method for increasing dynamic range of a pixel by multiple incomplete reset
CYPRESS SEMICONDUCTOR CORP BEL18 citations84
US7289148B1Oct 30, 2007
Devices and methods for improving the image quality in an image sensor
CYPRESS SEMICONDUCTOR CORP BEL11 citations79
US7199410B2Apr 3, 2007
Pixel structure with improved charge transfer
CYPRESS SEMICONDUCTOR CORP BEL8 citations73
DIERICKX BART
5 patentsUS8440957B2May 14, 2013
Counting pixel with good dynamic range properties
DIERICKX BART33 citations92
US8198577B2Jun 12, 2012
High dynamic range analog X-ray photon counting
DIERICKX BART22 citations92
US8426828B2Apr 23, 2013
Combined integration and pulse detection
DIERICKX BART17 citations84
US8063963B2Nov 22, 2011
Imaging device having a pixel structure with high dynamic range read-out signal
DIERICKX BART13 citations84
US7564022B1Jul 21, 2009
Method and device for time-gating the sensitivity of an imager structure
DIERICKX BART8 citations84
FILLFACTORY
4 patentsUS6683360B1Jan 27, 2004
Multiple or graded epitaxial wafers for particle or radiation detection
FILLFACTORY65 citations96
US6815791B1Nov 9, 2004
Buried, fully depletable, high fill factor photodiodes
FILLFACTORY35 citations92
US6690074B1Feb 10, 2004
Radiation resistant semiconductor device structure
FILLFACTORY30 citations92
US6917029B2Jul 12, 2005
Four-component pixel structure leading to improved image quality
FILLFACTORY4 citations62
IMEC
3 patentsUS6225670B1May 1, 2001
Detector for electromagnetic radiation, pixel structure with high sensitivity using such detector and method of manufacturing such detector
IMEC102 citations98
US6011251AJan 4, 2000
Method for obtaining a high dynamic range read-out signal of a CMOS-based pixel structure and such CMOS-based pixel structure
IMEC94 citations96
US8036870B2Oct 11, 2011
Simulation method for efficient characterization of electronic systems under variability effects
IMEC2 citations62
IMEC VZW
3 patentsUS5933190AAug 3, 1999
Pixel structure, image sensor using such pixel structure and corresponding peripheral circuitry
IMEC VZW286 citations95
US6833868B1Dec 21, 2004
Method and device for determining corrected color aspects of a pixel in an imaging device
IMEC VZW26 citations92
US5953060ASep 14, 1999
Method for reducing fixed pattern noise in solid state imaging devices
IMEC VZW53 citations92