Inventor
LONG MAOLIN
US70 patents
⚠️ This page may combine multiple inventors who share the name “LONG MAOLIN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
LAM RES CORP
33 patentsUS9583357B1Feb 28, 2017
Systems and methods for reverse pulsing
LAM RES CORP98 citations99
US9761459B2Sep 12, 2017
Systems and methods for reverse pulsing
LAM RES CORP93 citations98
US9515633B1Dec 6, 2016
Transformer coupled capacitive tuning circuit with fast impedance switching for plasma etch chambers
LAM RES CORP60 citations98
US10264663B1Apr 16, 2019
Matchless plasma source for semiconductor wafer fabrication
LAM RES CORP29 citations97
US9059678B2Jun 16, 2015
TCCT match circuit for plasma etch chambers
LAM RES CORP29 citations94
US10638593B2Apr 28, 2020
Matchless plasma source for semiconductor wafer fabrication
LAM RES CORP10 citations92
US11716805B2Aug 1, 2023
Matchless plasma source for semiconductor wafer fabrication
LAM RES CORP4 citations85
US11224116B2Jan 11, 2022
Matchless plasma source for semiconductor wafer fabrication
LAM RES CORP4 citations84
US10847345B2Nov 24, 2020
Direct drive RF circuit for substrate processing systems
LAM RES CORP7 citations84
US10784083B2Sep 22, 2020
RF voltage sensor incorporating multiple voltage dividers for detecting RF voltages at a pickup device of a substrate support
LAM RES CORP8 citations84
US10515781B1Dec 24, 2019
Direct drive RF circuit for substrate processing systems
LAM RES CORP13 citations84
US10121641B2Nov 6, 2018
Large dynamic range RF voltage sensor and method for voltage mode RF bias application of plasma processing systems
LAM RES CORP8 citations84
US12106947B2Oct 1, 2024
RF reference measuring circuit for a direct drive system supplying power to generate plasma in a substrate processing system
LAM RES CORP2 citations73
US11728136B2Aug 15, 2023
RF pulsing within pulsing for semiconductor RF plasma processing
LAM RES CORP2 citations73
US11342159B2May 24, 2022
RF pulsing within pulsing for semiconductor RF plasma processing
LAM RES CORP2 citations73
US10715095B2Jul 14, 2020
Radiofrequency (RF) filter for multi-frequency RF bias
LAM RES CORP2 citations73
US10672590B2Jun 2, 2020
Frequency tuning for a matchless plasma source
LAM RES CORP3 citations73
US10332725B2Jun 25, 2019
Systems and methods for reversing RF current polarity at one output of a multiple output RF matching network
LAM RES CORP5 citations73
US10056231B2Aug 21, 2018
TCCT match circuit for plasma etch chambers
LAM RES CORP2 citations73
US9384948B2Jul 5, 2016
Hammerhead TCP coil support for high RF power conductor etch systems
LAM RES CORP6 citations73
US12283463B2Apr 22, 2025
Systems and methods for multi-level pulsing in RF plasma tools
LAM RES CORP0 citations63
US10649006B2May 12, 2020
Cathode RF asymmetry detection probe for semiconductor RF plasma processing equipment
LAM RES CORP1 citations63
US12507338B2Dec 23, 2025
Matchless plasma source for semiconductor wafer fabrication
LAM RES CORP0 citations62
US12490370B2Dec 2, 2025
Matchless plasma source for semiconductor wafer fabrication
LAM RES CORP0 citations62
US12484139B2Nov 25, 2025
Matchless plasma source for semiconductor wafer fabrication
LAM RES CORP0 citations62
US12471202B2Nov 11, 2025
Matchless plasma source for semiconductor wafer fabrication
LAM RES CORP0 citations62
US12437966B2Oct 7, 2025
Systems and methods for reverse pulsing
LAM RES CORP0 citations62
US12424410B2Sep 23, 2025
RF pulsing within pulsing for semiconductor RF plasma processing
LAM RES CORP0 citations62
US12261029B2Mar 25, 2025
Protection system for switches in direct drive circuits of substrate processing systems
LAM RES CORP0 citations62
US12193138B2Jan 7, 2025
Matchless plasma source for semiconductor wafer fabrication
LAM RES CORP0 citations62
US12165841B2Dec 10, 2024
Dual-frequency, direct-drive inductively coupled plasma source
LAM RES CORP0 citations62
US11798785B2Oct 24, 2023
Systems for reverse pulsing
LAM RES CORP0 citations62
US11728137B2Aug 15, 2023
Direct frequency tuning for matchless plasma source in substrate processing systems
LAM RES CORP1 citations62
MATTSON TECH INC
5 patentsUS12159770B2Dec 3, 2024
Cooled shield for ICP source
MATTSON TECH INC2 citations73
US12040159B2Jul 16, 2024
Dual frequency matching circuit for inductively coupled plasma (ICP) loads
MATTSON TECH INC2 citations73
US12400831B2Aug 26, 2025
Dual frequency matching circuit for inductively coupled plasma (ICP) loads
MATTSON TECH INC0 citations63
US12334312B2Jun 17, 2025
Configurable faraday shield
MATTSON TECH INC0 citations63
US12002701B2Jun 4, 2024
Electrostatic chuck assembly for plasma processing apparatus
MATTSON TECH INC0 citations63
TOKYO ELECTRON LTD
4 patentsUS6811651B2Nov 2, 2004
Gas temperature control for a plasma process
TOKYO ELECTRON LTD49 citations96
US6916401B2Jul 12, 2005
Adjustable segmented electrode apparatus and method
TOKYO ELECTRON LTD35 citations93
US7531061B2May 12, 2009
Gas temperature control for a plasma process
TOKYO ELECTRON LTD12 citations84
US7091503B2Aug 15, 2006
Measuring plasma uniformity in-situ at wafer level
TOKYO ELECTRON LTD8 citations74
LONG MAOLIN
3 patentsBEIJING E TOWN SEMICONDUCTOR TECH CO LTD
2 patentsAPPLIED MATERIALS INC
1 patentHUAWEI TECH CO LTD
1 patentDREWERY JOHN
1 patentShowing the top 50 of 70 patents by PatentIndex Score.