Inventor
LIU CHIH-CHENG
CN58 patents
⚠️ This page may combine multiple inventors who share the name “LIU CHIH-CHENG”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
CHANGXIN MEMORY TECH INC
22 patentsUS12288759B2Apr 29, 2025
Semiconductor redistribution structure with integrated test pad and method for preparing the same
CHANGXIN MEMORY TECH INC1 citations64
US12334415B2Jun 17, 2025
Through vias with test structure
CHANGXIN MEMORY TECH INC0 citations63
US12159828B2Dec 3, 2024
Semiconductor structure with shielding structure for through silicon via and manufacturing method thereof
CHANGXIN MEMORY TECH INC0 citations63
US12336161B2Jun 17, 2025
Semiconductor structure and manufacturing method thereof
CHANGXIN MEMORY TECH INC0 citations62
US12324148B2Jun 3, 2025
Method for forming semiconductor structure and a semiconductor
CHANGXIN MEMORY TECH INC0 citations62
US12255125B2Mar 18, 2025
Semiconductor structure and manufacturing method thereof
CHANGXIN MEMORY TECH INC0 citations62
US12191350B2Jan 7, 2025
Method of manufacturing semiconductor structure and semiconductor structure
CHANGXIN MEMORY TECH INC0 citations62
US12069850B2Aug 20, 2024
Semiconductor structure, manufacturing method thereof, and memory having bit line conducting layers covering the bit line contact layer and the insulating layer
CHANGXIN MEMORY TECH INC0 citations62
US12027456B2Jul 2, 2024
Semiconductor structure and manufacturing method thereof
CHANGXIN MEMORY TECH INC0 citations62
US11864377B2Jan 2, 2024
Semiconductor structure and method for manufacturing same
CHANGXIN MEMORY TECH INC0 citations62
US11843026B2Dec 12, 2023
Method for manufacturing semiconductor structure and semiconductor structure
CHANGXIN MEMORY TECH INC0 citations62
US11798881B2Oct 24, 2023
Anti-fuse structure and method for fabricating same, as well as semiconductor device
CHANGXIN MEMORY TECH INC0 citations62
US11387239B2Jul 12, 2022
Semiconductor memory device structure
CHANGXIN MEMORY TECH INC1 citations62
US11043450B2Jun 22, 2021
Anti-fuse structure and method for fabricating same, as well as semiconductor device
CHANGXIN MEMORY TECH INC0 citations62
US10885956B2Jan 5, 2021
Dynamic random access memory array, semiconductor layout structure and fabrication method thereof
CHANGXIN MEMORY TECH INC1 citations62
US12538476B2Jan 27, 2026
Semiconductor structure and method for forming semiconductor structure
CHANGXIN MEMORY TECH INC0 citations52
US12505876B2Dec 23, 2025
Layout structure forming method of sense amplifier and layout structure of sense amplifier
CHANGXIN MEMORY TECH INC0 citations52
US12349372B2Jul 1, 2025
Method of forming semiconductor structure and semiconductor structure
CHANGXIN MEMORY TECH INC0 citations52
US12336160B2Jun 17, 2025
Static random access memory cell and method for forming same
CHANGXIN MEMORY TECH INC0 citations52
US12159836B2Dec 3, 2024
Semiconductor structure and method for fabricating a semiconductor structure
CHANGXIN MEMORY TECH INC0 citations52
US12132077B2Oct 29, 2024
Semiconductor structure and manufacturing method thereof
CHANGXIN MEMORY TECH INC0 citations52
US12106799B2Oct 1, 2024
Forming method of sense amplifier and layout structure of sense amplifier
CHANGXIN MEMORY TECH INC0 citations52
TAIWAN SEMICONDUCTOR MFG CO LTD
16 patentsUS11705332B2Jul 18, 2023
Photoresist layer surface treatment, cap layer, and method of forming photoresist pattern
TAIWAN SEMICONDUCTOR MFG CO LTD9 citations85
US12159787B2Dec 3, 2024
Method of manufacturing a semiconductor device and pattern formation method
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations73
US12057315B2Aug 6, 2024
Photoresist layer surface treatment, cap layer, and method of forming photoresist pattern
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations73
US12002675B2Jun 4, 2024
Photoresist layer outgassing prevention
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations73
US11822237B2Nov 21, 2023
Method of manufacturing a semiconductor device
TAIWAN SEMICONDUCTOR MFG CO LTD3 citations73
US11726405B2Aug 15, 2023
Photoresist for semiconductor fabrication
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations73
US12494368B2Dec 9, 2025
Photoresist and method
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US12463034B2Nov 4, 2025
Photoresist layer surface treatment, cap layer, and method of forming photoresist pattern
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US12374548B2Jul 29, 2025
Photoresist layer outgassing prevention
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US12222643B2Feb 11, 2025
Method of manufacturing a semiconductor device and pattern formation method
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US12153346B2Nov 26, 2024
Photoresist for semiconductor fabrication
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US12135501B2Nov 5, 2024
Method of manufacturing a semiconductor device
TAIWAN SEMICONDUCTOR MFG CO LTD1 citations62
US12044966B2Jul 23, 2024
Photoresist for semiconductor fabrication
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US12487523B2Dec 2, 2025
In-situ deposition and densification treatment for metal-comprising resist layer
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations52
US12271113B2Apr 8, 2025
Method of manufacturing a semiconductor device
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations52
US12272554B2Apr 8, 2025
Method of manufacturing a semiconductor device
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations52
UNITED MICROELECTRONICS CORP
8 patentsUS6441436B1Aug 27, 2002
SOI device and method of fabrication
UNITED MICROELECTRONICS CORP187 citations97
US6392924B1May 21, 2002
Array for forming magnetoresistive random access memory with pseudo spin valve
UNITED MICROELECTRONICS CORP39 citations92
US6197677B1Mar 6, 2001
Method of depositing a silicon oxide layer on a semiconductor wafer
UNITED MICROELECTRONICS CORP23 citations91
US6271088B1Aug 7, 2001
Method for fabricating a buried vertical split gate memory device with high coupling ratio
UNITED MICROELECTRONICS CORP20 citations83
US6159833ADec 12, 2000
Method of forming a contact hole in a semiconductor wafer
UNITED MICROELECTRONICS CORP8 citations73
US6235354B1May 22, 2001
Method of forming a level silicon oxide layer on two regions of different heights on a semiconductor wafer
UNITED MICROELECTRONICS CORP11 citations72
US6221703B1Apr 24, 2001
Method of ion implantation for adjusting the threshold voltage of MOS transistors
UNITED MICROELECTRONICS CORP6 citations63
US6466474B1Oct 15, 2002
Memory module having a two-transistor memory cell
UNITED MICROELECTRONICS CORP2 citations61
UNIV TAMKANG
2 patentsSILICONGEAR CORP
1 patentPOWERCHIP SEMICONDUCTOR CORP
1 patentShowing the top 50 of 58 patents by PatentIndex Score.