Inventor

SANNOMIYA TAKUMI

JP2 patents

Patents

2 patents

US7619220B2Nov 17, 2009

Method of measuring aberrations and correcting aberrations using Ronchigram and electron microscope

JEOL LTD10 citations79

US7683320B2Mar 23, 2010

Transmission electron microscope

JEOL LTD2 citations57