P

Inventor

ROY RAJIV

US13 patents
⚠️ This page may combine multiple inventors who share the name “ROY RAJIV”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

SEMICONDUCTOR TECH & INSTR INC

6 patents
US6118540ASep 12, 2000

Method and apparatus for inspecting a workpiece

SEMICONDUCTOR TECH & INSTR INC99 citations95
US5956134ASep 21, 1999

Inspection system and method for leads of semiconductor devices

SEMICONDUCTOR TECH & INSTR INC68 citations91
US6252981B1Jun 26, 2001

System and method for selection of a reference die

SEMICONDUCTOR TECH & INSTR INC41 citations90
US6765666B1Jul 20, 2004

System and method for inspecting bumped wafers

SEMICONDUCTOR TECH & INSTR INC18 citations87
US5745593AApr 28, 1998

Method and system for inspecting integrated circuit lead burrs

SEMICONDUCTOR TECH & INSTR INC16 citations71
US5777886AJul 7, 1998

Programmable lead conditioner

SEMICONDUCTOR TECH & INSTR INC10 citations67

TEXAS INSTRUMENTS INC

2 patents
US5987161ANov 16, 1999

Apparatus and method for identifying defective objects

TEXAS INSTRUMENTS INC20 citations87
US5402505AMar 28, 1995

Semiconductor device lead inspection system

TEXAS INSTRUMENTS INC17 citations72

CADENCE DESIGN SYSTEMS INC

2 patents
US10430215B1Oct 1, 2019

Method and system to transfer data between hardware emulator and host workstation

CADENCE DESIGN SYSTEMS INC11 citations80
US11475192B1Oct 18, 2022

Methods and apparatus for buffered assertion reporting in emulation

CADENCE DESIGN SYSTEMS INC0 citations41

LSI CORP

2 patents
US9053761B2Jun 9, 2015

Circuit and method for improving sense amplifier reaction time in memory read operations

LSI CORP0 citations51
US8988959B2Mar 24, 2015

Circuit and method for dynamically changing a trip point in a sensing inverter

LSI CORP1 citations51

RUDOLPH TECH INC

1 patent
US9952041B2Apr 24, 2018

Assessing alignment of top and bottom ends of TSVs and characterizing microfabrication process

RUDOLPH TECH INC0 citations46