Inventor
UEKI NOBUAKI
JP42 patents
⚠️ This page may combine multiple inventors who share the name “UEKI NOBUAKI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
FUJI XEROX CO LTD
26 patentsUS6529541B1Mar 4, 2003
Surface emitting semiconductor laser
FUJI XEROX CO LTD79 citations98
US6320893B1Nov 20, 2001
Surface emitting semiconductor laser
FUJI XEROX CO LTD97 citations98
US6816527B2Nov 9, 2004
Surface emitting semiconductor laser
FUJI XEROX CO LTD43 citations92
US6650683B2Nov 18, 2003
Surface emitting semiconductor laser
FUJI XEROX CO LTD30 citations92
US5880766AMar 9, 1999
Apparatus for correcting positional deviation of light source emitting light beams in image recording apparatus
FUJI XEROX CO LTD23 citations92
US5809052ASep 15, 1998
Semiconductor laser array driving method, semiconductor laser array driving device and image forming apparatus
FUJI XEROX CO LTD30 citations92
US6483860B1Nov 19, 2002
Surface emitting semiconductor laser with oxidized post structure
FUJI XEROX CO LTD16 citations84
US7352787B2Apr 1, 2008
Vertical cavity surface emitting laser diode and process for producing the same
FUJI XEROX CO LTD10 citations82
US7443899B2Oct 28, 2008
Surface emitting semiconductor laser diode and manufacturing method thereof
FUJI XEROX CO LTD8 citations74
US7346089B2Mar 18, 2008
Surface-emitting laser diode with tunnel junction and fabrication method thereof
FUJI XEROX CO LTD7 citations74
US6636542B1Oct 21, 2003
Surface emitting semiconductor laser, surface emitting semiconductor laser array, and method for manufacturing surface emitting semiconductor laser
FUJI XEROX CO LTD9 citations74
US5990494ANov 23, 1999
Optoelectro transducer array, and light-emitting device array and fabrication process thereof
FUJI XEROX CO LTD10 citations74
US5963242AOct 5, 1999
Image recording apparatus with an array light source
FUJI XEROX CO LTD12 citations74
US5588016ADec 24, 1996
Semiconductor laser device
FUJI XEROX CO LTD8 citations74
US5563901AOct 8, 1996
Semiconductor laser array
FUJI XEROX CO LTD13 citations74
US5533042AJul 2, 1996
Semiconductor laser device and driving method for the same as well as tracking servo system employing the same
FUJI XEROX CO LTD8 citations74
US5253265AOct 12, 1993
Semiconductor laser device
FUJI XEROX CO LTD11 citations74
US7336688B2Feb 26, 2008
Surface emitting semiconductor laser and method of manufacturing the same
FUJI XEROX CO LTD2 citations63
US7058104B2Jun 6, 2006
Surface emitting semiconductor laser and method of fabricating the same
FUJI XEROX CO LTD6 citations63
US5648295AJul 15, 1997
Method of making a semiconductor laser device
FUJI XEROX CO LTD3 citations63
US5491709AFeb 13, 1996
Semiconductor laser device
FUJI XEROX CO LTD3 citations63
US5394425AFeb 28, 1995
Method of manufacturing a semiconductor laser device
FUJI XEROX CO LTD3 citations63
US7957447B2Jun 7, 2011
VCSEL array device and method for manufacturing the VCSEL array device
FUJI XEROX CO LTD4 citations62
US7496123B2Feb 24, 2009
VCSEL with improved high frequency characteristics, semiconductor laser device, module, and optical transmission device
FUJI XEROX CO LTD4 citations61
US7366218B2Apr 29, 2008
Vertical cavity surface emitting laser diode and process for producing the same
FUJI XEROX CO LTD4 citations61
US7672352B2Mar 2, 2010
Surface-emitting semiconductor array device, module, light source device, data processing apparatus, light transmitting device, light spatial transmitting apparatus, and light spatial transmitting system
FUJI XEROX CO LTD0 citations47
FUJINON CORP
9 patentsUS6992779B2Jan 31, 2006
Interferometer apparatus for both low and high coherence measurement and method thereof
FUJINON CORP20 citations92
US7580133B2Aug 25, 2009
Interferometric apparatus for measuring moving object and optical interferometry method for measuring moving object
FUJINON CORP9 citations84
US7760365B2Jul 20, 2010
Aspheric lens surface-decenter measuring method and apparatus
FUJINON CORP7 citations74
US7340962B2Mar 11, 2008
Method and device for holding subject and measuring instrument equipped with the device
FUJINON CORP2 citations63
US7233400B2Jun 19, 2007
Interferometer for measuring virtual contact surfaces
FUJINON CORP6 citations63
US6912055B2Jun 28, 2005
Spherical form measuring and analyzing method
FUJINON CORP6 citations62
US6985605B2Jan 10, 2006
Phase unwrapping method for fringe image analysis
FUJINON CORP2 citations53
US7375825B2May 20, 2008
Light intensity ratio adjustment filter for an interferometer, interferometer, and light interference measurement method
FUJINON CORP1 citations52
US7342666B2Mar 11, 2008
Method and apparatus for measuring holding distortion
FUJINON CORP1 citations52
FUJI PHOTO OPTICAL CO LTD
3 patentsUS6018990AFeb 1, 2000
Flatness measuring and analyzing method
FUJI PHOTO OPTICAL CO LTD19 citations84
US6867871B2Mar 15, 2005
Moiré grating noise eliminating method
FUJI PHOTO OPTICAL CO LTD2 citations63
US6744523B2Jun 1, 2004
Imaging optical system for oblique incidence interferometer
FUJI PHOTO OPTICAL CO LTD0 citations41