Inventor

KAWASE KODO

JP12 patents

⚠️ This page may combine multiple inventors who share the name “KAWASE KODO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

RIKEN

5 patents

US6903341B2Jun 7, 2005

Apparatus for generating tera-Hertz wave and tuning method

RIKEN21 citations92

US6697186B2Feb 24, 2004

Method and apparatus for generating tera-hertz wave

RIKEN56 citations92

US7381955B2Jun 3, 2008

Method and apparatus for inspecting target by tera-hertz wave spectrometry

RIKEN5 citations60

US7352449B2Apr 1, 2008

Method and apparatus for detecting materials

RIKEN3 citations60

US7291838B2Nov 6, 2007

Apparatus and method for detecting scattered material by terahertz wave

RIKEN1 citations51

DAIDO SHIGEKI

1 patent

US8119988B2Feb 21, 2012

Collection-amount detection method for particulate matters and collection-amount detection apparatus therefor and exhaust-gas converting apparatus

DAIDO SHIGEKI19 citations78

SHIBUYA CORP

1 patent

US9897893B2Feb 20, 2018

Terahertz wave generation apparatus

SHIBUYA CORP4 citations70

NISHINA SHIGEKI

1 patent

US8493057B2Jul 23, 2013

Electromagnetic wave measuring apparatus, measuring method, program, and recording medium

NISHINA SHIGEKI5 citations70

AISIN SEIKI

1 patent

US6980010B2Dec 27, 2005

Method and apparatus for inspecting wire breaking of integrated circuit

AISIN SEIKI11 citations66

NEC ELECTRONICS CORP

1 patent

US7173447B2Feb 6, 2007

Method and apparatus for diagnosing fault in semiconductor device

NEC ELECTRONICS CORP6 citations59

ADVANTEST CORP

1 patent

US9176008B2Nov 3, 2015

Electromagnetic wave measuring apparatus, measuring method, program, and recording medium

ADVANTEST CORP0 citations51

MAKI KEN-ICHIRO

1 patent

US8121157B2Feb 21, 2012

Terahertz beam scanning apparatus and method thereof

MAKI KEN-ICHIRO3 citations51