Inventor
CUSSON BRIAN K
US15 patents
Patents
15 patentsUS6778873B1Aug 17, 2004
Identifying a cause of a fault based on a process controller output
ADVANCED MICRO DEVICES INC56 citations96
US6766214B1Jul 20, 2004
Adjusting a sampling rate based on state estimation results
ADVANCED MICRO DEVICES INC69 citations96
US7031793B1Apr 18, 2006
Conflict resolution among multiple controllers
ADVANCED MICRO DEVICES INC20 citations92
US6953697B1Oct 11, 2005
Advanced process control of the manufacture of an oxide-nitride-oxide stack of a memory device, and system for accomplishing same
ADVANCED MICRO DEVICES INC46 citations91
US6740534B1May 25, 2004
Determination of a process flow based upon fault detection analysis
ADVANCED MICRO DEVICES INC34 citations91
US6446022B1Sep 3, 2002
Wafer fabrication system providing measurement data screening
ADVANCED MICRO DEVICES INC24 citations88
US6834211B1Dec 21, 2004
Adjusting a trace data rate based upon a tool state
ADVANCED MICRO DEVICES INC15 citations84
US6424876B1Jul 23, 2002
Statistical process control system with normalized control charting
ADVANCED MICRO DEVICES INC43 citations84
US7246290B1Jul 17, 2007
Determining the health of a desired node in a multi-level system
ADVANCED MICRO DEVICES INC16 citations83
US6991945B1Jan 31, 2006
Fault detection spanning multiple processes
ADVANCED MICRO DEVICES INC11 citations83
US6925347B1Aug 2, 2005
Process control based on an estimated process result
ADVANCED MICRO DEVICES INC13 citations83
US6985825B1Jan 10, 2006
Method and apparatus for adaptive sampling based on process covariance
ADVANCED MICRO DEVICES INC9 citations73
US6800562B1Oct 5, 2004
Method of controlling wafer charging effects due to manufacturing processes
ADVANCED MICRO DEVICES INC11 citations73
US7581140B1Aug 25, 2009
Initiating test runs based on fault detection results
ADVANCED MICRO DEVICES INC3 citations62
US7117062B1Oct 3, 2006
Determining transmission of error effects for improving parametric performance
ADVANCED MICRO DEVICES INC5 citations62