Inventor

VERSPECHT JAN

BE23 patents

⚠️ This page may combine multiple inventors who share the name “VERSPECHT JAN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

VERSPECHT JAN

KEYSIGHT TECHNOLOGIES INC

Nonlinear distortion detection

System and method of measuring full spectrum of modulated output signal from device under test

Measurement of periodically modulated signals under non-coherent operating conditions

Method for measuring frequency offset between an RF transmitter and a test receiver

Method and apparatus for characterizing local oscillator path dispersion

Method and apparatus for spectral stitching discontinuous spectra using reference channel, pilot tones and comb signal

Method and system of preventing interference caused by images

Method and apparatus for characterizing homodyne transmitters and receivers

Phase distortion measurement

Method and apparatus for reducing non-linear distortion

Method and system for characterizing phase dispersion in intermediate frequency channel of receiver

Method and apparatus for spectral stitching using reference channel and a pilot tone

VERSPECHT JAN

Method and an apparatus for characterizing a high-frequency device-under-test in a large signal impedance tuning environment

Method and a test setup for measuring large-signal S-parameters that include the coefficients relating to the conjugate of the incident waves

Method for characterizing high-frequency mixers

Method for predistorting signals for non-linear components in the presence of long term memory effects

Method to measure the mutual phase relationship of a set of spectral components generated by a signal generator

Method and system for characterizing, modeling and simulating non-linear components having long term memory effects

AGILENT TECHNOLOGIES INC

Method of and an arrangement for characterizing non-linear behavior of RF and microwave devices in a near matched environment

Apparatus for collecting signal measurement data at signal ports of an RF and microwave device-under-test, under different impedance load conditions

Method for generating a circuit model

Providing controllable impedance at a reference plane in a circuit

Method of and an apparatus for collecting RF input and output and biasing signal data of a device under test