Inventor
MURAKAMI KIYOSHI
JP14 patents
⚠️ This page may combine multiple inventors who share the name “MURAKAMI KIYOSHI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
OMRON TATEISI ELECTRONICS CO
10 patentsUS6947151B2Sep 20, 2005
Surface state inspecting method and substrate inspecting apparatus
OMRON TATEISI ELECTRONICS CO34 citations91
US7394084B2Jul 1, 2008
Method of generating image and illumination device for inspecting substrate
OMRON TATEISI ELECTRONICS CO20 citations90
US7505149B2Mar 17, 2009
Apparatus for surface inspection and method and apparatus for inspecting substrate
OMRON TATEISI ELECTRONICS CO9 citations81
US7114249B2Oct 3, 2006
Substrate inspecting method and substrate inspecting apparatus using the method
OMRON TATEISI ELECTRONICS CO9 citations72
US7310406B2Dec 18, 2007
Inspection method and system for and method of producing component mounting substrate
OMRON TATEISI ELECTRONICS CO8 citations71
US8351682B2Jan 8, 2013
X-ray examination region setting method, X-ray examination apparatus and X-ray examination region setting program
OMRON TATEISI ELECTRONICS CO3 citations62
US7512260B2Mar 31, 2009
Substrate inspection method and apparatus
OMRON TATEISI ELECTRONICS CO5 citations62
US7680320B2Mar 16, 2010
Image processing method, substrate inspection method, substrate inspection apparatus and method of generating substrate inspection data
OMRON TATEISI ELECTRONICS CO2 citations60
US7822566B2Oct 26, 2010
Method, device and program for setting a reference value for substrate inspection
OMRON TATEISI ELECTRONICS CO1 citations51
US7869644B2Jan 11, 2011
Methods of and apparatus for inspecting substrate
OMRON TATEISI ELECTRONICS CO1 citations49