Inventor

SARTSCHEV RONALD A

US24 patents

⚠️ This page may combine multiple inventors who share the name “SARTSCHEV RONALD A”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

SARTSCHEV RONALD A

TERADYNE INC

Compact ATE with time stamp system

High speed tester with narrow output pulses

Temperature control structure

Automatic test equipment with narrow output pulses

Method and system for testing semiconductor devices

Low cost CMOS tester with high channel density

Strobe technique for time stamping a digital signal

Method and system for monitoring test signals for semiconductor devices

Pin electronics with high voltage functionality

Using a parametric measurement unit for converter testing

Low-cost configuration for monitoring and controlling parametric measurement units in automatic test equipment

Edge generator-based phase locked loop reference clock generator for automated test system

Strobe technique for recovering a clock in a digital signal

Pin electronics driver

Automated test system with edge steering

Automatic test equipment using sigma delta modulation to create reference levels

Strobe technique for test of digital signal timing

Method and system for producing signals to test semiconductor devices

Calibrating jitter

Pin electronics driver

Apparatus and method for operating source synchronous devices

VAN DER WAGT JAN PAUL ANTHONIE

Edge triggered calibration

BREINLINGER KEITH

Pin electronics liquid cooled multi-module for high performance, low cost automated test equipment

SARTSCHEV RONALD A

Automated test system with event detection capability