Inventor
NOMURA MASAYOSHI
JP52 patents
⚠️ This page may combine multiple inventors who share the name “NOMURA MASAYOSHI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
MICHELIN & CIE
18 patentsUSD851576SJun 18, 2019
Tire tread
MICHELIN & CIE21 citations91
USD855010SJul 30, 2019
Tire
MICHELIN & CIE7 citations82
USD821292SJun 26, 2018
Tire tread
MICHELIN & CIE2 citations73
US11577552B2Feb 14, 2023
Tire tread with sipes
MICHELIN & CIE2 citations71
USD855555SAug 6, 2019
Tire
MICHELIN & CIE3 citations71
USD1112029SFeb 10, 2026
Tire sidewall
MICHELIN & CIE0 citations61
USD1110938SFeb 3, 2026
Tire sidewall
MICHELIN & CIE0 citations61
USD1106939SDec 23, 2025
Tire sidewall
MICHELIN & CIE0 citations61
USD1106046SDec 16, 2025
Tire sidewall
MICHELIN & CIE0 citations61
USD1106047SDec 16, 2025
Tire sidewall
MICHELIN & CIE0 citations61
USD1104940SDec 9, 2025
Tire sidewall
MICHELIN & CIE0 citations61
USD1069683SApr 8, 2025
Tire
MICHELIN & CIE1 citations60
USD1070736SApr 15, 2025
Tire
MICHELIN & CIE0 citations58
USD1063802SFeb 25, 2025
Tire
MICHELIN & CIE0 citations58
USD1046757SOct 15, 2024
Tire
MICHELIN & CIE0 citations58
US11633991B2Apr 25, 2023
Tire provided with a texture on a sidewall
MICHELIN & CIE0 citations51
USD1081529SJul 1, 2025
Tire
MICHELIN & CIE0 citations50
US10155419B2Dec 18, 2018
Tread comprising a block having a plurality of sipes
MICHELIN & CIE1 citations50
MICRON TECHNOLOGY INC
10 patentsUS8004920B2Aug 23, 2011
Power saving memory apparatus, systems, and methods
MICRON TECHNOLOGY INC32 citations92
US7733731B2Jun 8, 2010
Control of inputs to a memory device
MICRON TECHNOLOGY INC10 citations84
US7721163B2May 18, 2010
JTAG controlled self-repair after packaging
MICRON TECHNOLOGY INC8 citations84
US7612574B2Nov 3, 2009
Systems and methods for defect testing of externally accessible integrated circuit interconnects
MICRON TECHNOLOGY INC12 citations84
US7831870B2Nov 9, 2010
JTAG controlled self-repair after packaging
MICRON TECHNOLOGY INC4 citations74
US7990163B2Aug 2, 2011
Systems and methods for defect testing of externally accessible integrated circuit interconnects
MICRON TECHNOLOGY INC3 citations63
US8611168B2Dec 17, 2013
Control of inputs to a memory device
MICRON TECHNOLOGY INC2 citations62
US8014222B2Sep 6, 2011
Control of inputs to a memory device
MICRON TECHNOLOGY INC3 citations62
US9082471B2Jul 14, 2015
Power saving memory apparatus, systems, and methods
MICRON TECHNOLOGY INC0 citations52
US9042195B2May 26, 2015
Control of inputs to a memory device
MICRON TECHNOLOGY INC0 citations52
NOMURA MASAYOSHI
8 patentsUSD767473SSep 27, 2016
Tire tread
NOMURA MASAYOSHI18 citations92
USD739339SSep 22, 2015
Tire tread
NOMURA MASAYOSHI41 citations92
USD658115SApr 24, 2012
Pneumatic tire
NOMURA MASAYOSHI23 citations91
USD654425SFeb 21, 2012
Pneumatic tire
NOMURA MASAYOSHI28 citations91
USD735658SAug 4, 2015
Surface design for a pneumatic tire
NOMURA MASAYOSHI5 citations73
US10301424B2May 28, 2019
Polythiophene derivative, secondary cell positive electrode active material, and secondary cell
NOMURA MASAYOSHI0 citations52
US10283777B2May 7, 2019
Secondary battery
NOMURA MASAYOSHI0 citations52
US9991518B2Jun 5, 2018
Polythiophene derivative, method for producing same, positive electrode active material for secondary batteries, and secondary battery
NOMURA MASAYOSHI0 citations52
TEXAS INSTRUMENTS INC
5 patentsUS6304148B1Oct 16, 2001
Oscillator circuit for a semiconductor memory having a temperature dependent cycle
TEXAS INSTRUMENTS INC40 citations91
US5359559AOct 25, 1994
Semiconductor memory device having redundant memory cells
TEXAS INSTRUMENTS INC22 citations91
US4882710ANov 21, 1989
FIFO memory including dynamic memory elements
TEXAS INSTRUMENTS INC36 citations89
US5469385ANov 21, 1995
Output buffer with boost from voltage supplies
TEXAS INSTRUMENTS INC6 citations63
US4888736ADec 19, 1989
Semiconductor memory device using stored capacitor charge for writing data
TEXAS INSTRUMENTS INC6 citations63
FUJIWARA YOSHINORI
3 patentsUS8230274B2Jul 24, 2012
JTAG controlled self-repair after packaging
FUJIWARA YOSHINORI7 citations83
US8122304B2Feb 21, 2012
JTAG controlled self-repair after packaging
FUJIWARA YOSHINORI2 citations62
US8736291B2May 27, 2014
Methods for defect testing of externally accessible integrated circuit interconnects
FUJIWARA YOSHINORI0 citations51
ITO YUTAKA
2 patentsHITACHI LTD
1 patentMICHELIN SOC TECH
1 patentFRAPPART ARNAUD
1 patentRICOH CO LTD
1 patentShowing the top 50 of 52 patents by PatentIndex Score.