Inventor
AOYAMA TAKASHI
JP77 patents
⚠️ This page may combine multiple inventors who share the name “AOYAMA TAKASHI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
HITACHI LTD
15 patentsUS5247375ASep 21, 1993
Display device, manufacturing method thereof and display panel
HITACHI LTD165 citations99
US5294811AMar 15, 1994
Thin film semiconductor device having inverted stagger structure, and device having such semiconductor device
HITACHI LTD170 citations98
US4954855ASep 4, 1990
Thin film transistor formed on insulating substrate
HITACHI LTD57 citations96
US4388342AJun 14, 1983
Method for chemical vapor deposition
HITACHI LTD60 citations96
US5367171ANov 22, 1994
Electron microscope specimen holder
HITACHI LTD74 citations94
US5153702AOct 6, 1992
Thin film semiconductor device and method for fabricating the same
HITACHI LTD81 citations94
US5119415AJun 2, 1992
Method of displaying called party information on calling party terminal and communication network using the method
HITACHI LTD48 citations93
US6794648B2Sep 21, 2004
Ultimate analyzer, scanning transmission electron microscope and ultimate analysis method
HITACHI LTD19 citations92
US6703613B2Mar 9, 2004
Energy spectrum measuring apparatus, electron energy loss spectrometer, electron microscope provided therewith, and electron energy loss spectrum measuring method
HITACHI LTD28 citations92
US6150657ANov 21, 2000
Energy filter and electron microscope equipped with the energy filter
HITACHI LTD34 citations92
US5898177AApr 27, 1999
Electron microscope
HITACHI LTD20 citations92
US5350921ASep 27, 1994
Analytical electron microscope and a method of operating such an electron microscope
HITACHI LTD49 citations92
US5828842AOct 27, 1998
Method of creating information for executing network management operations from a simplified definition of an operation sequence and providing a network management operation sequence, used in the information
HITACHI LTD52 citations88
US7928376B2Apr 19, 2011
Element mapping unit, scanning transmission electron microscope, and element mapping method
HITACHI LTD15 citations83
US6933501B2Aug 23, 2005
Ultimate analyzer, scanning transmission electron microscope and ultimate analysis method
HITACHI LTD10 citations74
SEIKO EPSON CORP
5 patentsUS10288426B2May 14, 2019
Circuit device, physical-quantity detecting apparatus, electronic apparatus, and moving object
SEIKO EPSON CORP3 citations73
US10031176B2Jul 24, 2018
Circuit device, physical quantity detection device, electronic apparatus, and moving object
SEIKO EPSON CORP2 citations73
US12031822B2Jul 9, 2024
Physical quantity detection circuit, physical quantity sensor, electronic instrument, vehicle, and method for diagnosing failure of physical quantity sensor
SEIKO EPSON CORP0 citations63
US11733045B2Aug 22, 2023
Physical quantity detection circuit, physical quantity sensor, electronic instrument, vehicle, and method for diagnosing failure of physical quantity sensor
SEIKO EPSON CORP0 citations63
US11300411B2Apr 12, 2022
Physical quantity detection circuit, physical quantity sensor, electronic instrument, vehicle, and method for diagnosing failure of physical quantity sensor
SEIKO EPSON CORP0 citations63
NISSAN MOTOR
4 patentsUS6845610B2Jan 25, 2005
Exhaust gas purification apparatus and method
NISSAN MOTOR48 citations92
US5622048AApr 22, 1997
Catalyst deterioration recovery device
NISSAN MOTOR19 citations92
US6173690B1Jan 16, 2001
In-cylinder direct-injection spark-ignition engine
NISSAN MOTOR40 citations89
US7146801B2Dec 12, 2006
Fuel vaporizing device
NISSAN MOTOR6 citations63
SONY CORP
3 patentsRENESAS TECH CORP
3 patentsUS7663179B2Feb 16, 2010
Semiconductor device with rewritable nonvolatile memory cell
RENESAS TECH CORP14 citations84
US7348245B2Mar 25, 2008
Semiconductor device and a method of manufacturing the same
RENESAS TECH CORP10 citations84
US7118972B2Oct 10, 2006
Method of manufacture of a semiconductor device
RENESAS TECH CORP9 citations74
UNIV ROCKEFELLER
2 patentsTOYODA AUTOMATIC LOOM WORKS
2 patentsHITACHI HIGH TECH CORP
2 patentsUS7250601B2Jul 31, 2007
Energy spectrum measuring apparatus, electron energy loss spectrometer, electron microscope provided therewith, and electron energy loss spectrum measuring method
HITACHI HIGH TECH CORP15 citations92
US7067805B2Jun 27, 2006
Energy spectrum measuring apparatus, electron energy loss spectrometer, electron microscope provided therewith, and electron energy loss spectrum measuring method
HITACHI HIGH TECH CORP17 citations89
AOYAMA TAKASHI
2 patentsUS8314513B2Nov 20, 2012
Power transmission control device, power transmission device, power reception control device, power reception device, electronic apparatus, and contactless power transmission system
AOYAMA TAKASHI28 citations91
US8395352B2Mar 12, 2013
Power transmission control device, power transmission device, electronic apparatus, and load state detection circuit
AOYAMA TAKASHI14 citations80
HITACHI METALS LTD
2 patentsMATSUSHITA ELECTRIC INDUSTRIAL CO LTD
2 patentsHITACHI CABLE
1 patentTANBA AKIHIRO
1 patentYASUDA SHUHEI
1 patentNINTENDO CO LTD
1 patentMATSUMOTO P & O CO LTD
1 patentMITSUBISHI FUSO TRUCK & BUS
1 patentSHIMOI RYOICHI
1 patentJAPAN AEROSPACE EXPLORATION
1 patentShowing the top 50 of 77 patents by PatentIndex Score.